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Defect prediction method and device

A prediction method and a technology of a prediction device, which are applied in the field of data processing and can solve problems such as failure to predict defects, overfitting or underfitting, etc.

Active Publication Date: 2014-09-03
HUAWEI TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, when there are many classification labels for the information of the recorded faulty products, the single decision tree generated by the classification algorithm based on the decision tree is likely to cause overfitting or underfitting, resulting in failure to predict defects

Method used

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  • Defect prediction method and device

Examples

Experimental program
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Effect test

Embodiment 1

[0089] An embodiment of the present invention provides a defect prediction method, such as figure 1 As shown, the method may include:

[0090] 101. Select a training attribute set from prestored product fault records according to the target attribute, and combine the target attribute and the training attribute set into a training set.

[0091] Among them, when a product fails, the fault detection personnel generally hope to quickly locate the defect type of the faulty product or the device that causes the product to fail, so as to save the maintenance time of the maintenance personnel, and to realize the fault detection The defect type of the product or the device that causes the product to be faulty can be quickly located by training the prediction model in advance. First, the fault detection personnel can collect the information of the product that has failed in the production process or in the process of use, and these The information is recorded in the product failure rec...

Embodiment 2

[0098] An embodiment of the present invention provides a defect prediction method, such as figure 2 As shown, the method may include:

[0099] 201. Select a training attribute set from prestored product fault records according to the target attribute, and combine the target attribute and the training attribute set into a training set.

[0100]Specifically, when a product fails during production or use, generally fault detection personnel hope to quickly locate the defect type of the faulty product or the faulty device, and for any product, The occurrence of faults or defects is related to the objective information of the product, such as the model of the product, the environment in which it is used, the source of raw materials, and so on. In order to quickly locate the defect type of the faulty product or the faulty device when the product has a fault or defect, it is possible to select from the product fault records of products that have failed during production or use. At...

Embodiment 3

[0139] An embodiment of the present invention provides a defect prediction device, such as image 3 As shown, it includes: a processing unit 31 , a generating unit 32 , and a predicting unit 33 .

[0140] The processing unit 31 is configured to select a training attribute set from pre-stored product failure records according to the target attribute, and combine the target attribute and the training attribute set into a training set; wherein the target attribute is a defect of a historical faulty product Attributes.

[0141] The generating unit 32 is configured to generate a classifier set according to the training set obtained by the processing unit 31; wherein, the classifier set includes at least two tree classifiers.

[0142] The prediction unit 33 is configured to use the set of classifiers generated by the generation unit 32 as a prediction model to predict defects of faulty products.

[0143] Further, the training set includes M training units, and each training unit i...

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Abstract

The present invention relates to the field of data processing. A defect prediction method and device, the method comprising: from a pre-stored product failure record selecting a training attribute set based on a target attribute, and combining the target attribute with the training attribute set to form a training set (101); the target attribute is the defect attribute of a historical faulty product; generating a classifier collection according to the training set, the classifier collection comprising at least two tree classifiers (102); and utilizing the classifier collection as a prediction model to predict the defects of a faulty product (103). The method is used in the defect prediction process of a faulty product to realize accurate and quick locating of a faulty product.

Description

technical field [0001] The invention relates to the field of data processing, in particular to a defect prediction method and device. Background technique [0002] With the development of the times, the types and quantities of products that can meet people's needs are gradually increasing, and the quality of products has become the main concern of users and enterprises, especially for enterprises, the quality of products is the foundation of enterprises, so It is very important for enterprises to reduce the defect rate of products. The main cause of product defects is the production process of the product, including the design of the product, the quality of the materials used, and the capabilities of the manufacturer. Therefore, for enterprises, if they want to reduce the defect rate of products, they need to analyze and improve the quality of products. production process to improve product quality. [0003] Each product has records of information about all aspects of the ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F19/00G06N20/00
CPCG06F19/00G06N20/00G06F16/9027G06N5/04
Inventor 陈焕华潘璐伽
Owner HUAWEI TECH CO LTD
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