Multifrequency aliasing resisting high-precision synchronous measuring scale phase laser ranging device and method

A technology of phase laser ranging and high-precision synchronization, which is applied in the field of laser measurement, can solve the problems that ultra-long wavelengths cannot be generated synchronously, the laser measuring ruler cannot be directly traced to the nonlinear period, and aliasing, etc., so as to overcome the non-direct traceability of the measuring ruler , Improve measurement efficiency and accuracy, and increase flexibility

Active Publication Date: 2014-09-17
HARBIN INST OF TECH
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  • Abstract
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Problems solved by technology

[0011] The purpose of the present invention is to solve the problems that the ultra-long wavelength and ultra-short wavelength cannot be synchronously generated in the existing phase laser ranging technology, the laser measuring ruler cannot be directly traced to the source, and the problems of nonlinear periodic error and frequency aliasing are provided. Anti-multi-frequency aliasing high-precision synchronous ruler phase laser ranging device and method to achieve the purpose of increasing the flexibility of ranging, simplifying the steps of ranging, and improving measurement efficiency, accuracy and real-time performance

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  • Multifrequency aliasing resisting high-precision synchronous measuring scale phase laser ranging device and method
  • Multifrequency aliasing resisting high-precision synchronous measuring scale phase laser ranging device and method
  • Multifrequency aliasing resisting high-precision synchronous measuring scale phase laser ranging device and method

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Embodiment Construction

[0036] Embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0037] A multi-frequency aliasing-resistant high-precision synchronous ruler phase laser ranging device, characterized in that: the device is composed of a ruler generating unit 1, a laser frequency shifting unit 2, an anti-aliasing measuring optical path 3 and a phase measuring unit 4 Composition, wherein the laser emitted by the measuring ruler generating unit 1 is output to the input end of the laser frequency shifting unit 2, the output reference laser beam 25 and the measuring laser beam 26 of the laser frequency shifting unit 2 are output to the anti-aliasing measurement optical path 3, and the anti-aliasing Measuring the output signal I of optical path 3 3 , I 4 , I 5 , I 6 input to the phase measurement unit 4 respectively;

[0038] The structure of the measuring ruler generating unit 1 is: the laser beam emitted by the frequency reference la...

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Abstract

The invention discloses a multifrequency aliasing resisting high-precision synchronous measuring scale phase laser ranging device and method, and belongs to a phase laser ranging technology. The ranging device comprises a measuring scale generating unit, a laser frequency shifting unit, an anti-aliasing measuring light path and a phase measuring unit. The ranging method comprises the first step that a frequency standard laser and frequency-offset-lock He-Ne lasers are started, the second step that one beam is adopted as a reference laser beam, and the other beam is adopted as measuring lasers, the third step that c / |v2-v3| is adopted as an accurate measuring scale, the fourth step that c / |v1-v2| is adopted as a rough measuring scale, and the fifth step that a measuring angle cone prism is moved to a target end, the phase difference phi1 of the accurate measuring scale and the phase difference phi2 of the rough measuring scale are obtained respectively, and finally the measured distance value is obtained through the formula. The problem that an overlength wave length and an ultrashort wave length cannot be generated synchronously and the laser measuring scales cannot directly trace to the source, and the problem of the nonlinear circular error and frequency aliasing are solved, and the multifrequency aliasing resisting high-precision synchronous measuring scale semiconductor laser ranging device and method have the advantages of being high in measuring efficiency, high in precision and high in stability and real-time performance.

Description

technical field [0001] The invention belongs to laser measurement technology, and mainly relates to a phase laser ranging device and method. Background technique [0002] Large-scale measurement has attracted much attention in the development of large-scale precision machinery manufacturing, major scientific and technological projects, aerospace industry, shipbuilding industry and microelectronic equipment industry and other large-scale optical-mechanical-electrical integration equipment processing and manufacturing. It is an important basis for the processing and overall assembly of large parts in aerospace vehicles and giant ships. The quality of its measurement methods and equipment performance directly affect the quality of workpieces and assembly accuracy, which in turn affects the operating quality, performance and life of the entire set of equipment. The multi-ruler phase ranging method uses a group of measuring ruler wavelengths from large to small to carry out step-...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01S11/12
CPCG01S11/12
Inventor 谭久彬杨宏兴胡鹏程
Owner HARBIN INST OF TECH
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