Anti-multi-frequency aliasing traceable synchronous ruler dual-light source laser ranging device and method

An anti-multi-frequency aliasing and synchronous measuring technology technology, applied in measuring devices, radio wave measurement systems, and re-radiation, etc. frequency and other problems, to overcome the direct traceability of the source, improve the measurement efficiency and accuracy, and eliminate common mode interference.

Active Publication Date: 2016-08-24
HARBIN INST OF TECH
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0011] The purpose of the present invention is to solve the problems that the ultra-long wavelength and ultra-short wavelength cannot be synchronously generated in the existing phase laser ranging technology, the laser measuring ruler cannot be directly traced to the source, and the problems of nonlinear periodic error and frequency aliasing are provided. Super-heterodyne and heterodyne-combined anti-optical aliasing laser ranging device and method to achieve the purpose of increasing the flexibility of ranging, simplifying the steps of ranging, and improving measurement efficiency, accuracy and real-time performance

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Anti-multi-frequency aliasing traceable synchronous ruler dual-light source laser ranging device and method
  • Anti-multi-frequency aliasing traceable synchronous ruler dual-light source laser ranging device and method
  • Anti-multi-frequency aliasing traceable synchronous ruler dual-light source laser ranging device and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0037] Embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0038] An anti-multi-frequency aliasing traceable synchronous ruler dual light source laser ranging device, characterized in that the device is composed of a measuring ruler generating unit 1, a laser frequency shifting unit 2, an anti-aliasing measuring optical path 3 and a phase measuring unit 4 components, wherein the laser output from measuring ruler generating unit 1 is output to the input end of laser frequency shifting unit 2, and the output reference laser beam 22 and measuring laser beam 23 of laser frequency shifting unit 2 are output to anti-aliasing measurement optical path 3, anti-aliasing The output signal I of stack measurement optical path 3 3 , I 4 , I 5 , I 6 input to the phase measurement unit 4 respectively;

[0039]The structure of the measuring ruler generation unit 1 is: the laser beam emitted by the frequency reference laser...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

A multi-frequency aliasing prevention traceable synchronous measuring tape double-light-source laser ranging device and method belongs to the phase laser ranging technology. The device comprises a measuring tape generating unit, a laser frequency shift unit, a beam expanding collimation lens group, a measuring light path and a circuit unit. The method comprises the steps of, firstly, starting a frequency reference laser device, a double-longitudinal-mode frequency stabilization He-Ne laser device and a semiconductor laser device; secondly, taking one beam as a reference laser beam and taking the other beam as a measuring laser beam; thirdly, taking c / Iv2-v3I as a fine measurement tape; fourthly, taking c / Iv1-v2I as a rough measurement tape; fifthly, moving a measuring pyramid prism to a target end to obtain the phase differences (i) phi ( / i) 1 and (i) phi ( / i) 2 of the fine measurement tape and the rough measurement tape; lastly, obtaining a measured distance value through formulas. The multi-frequency aliasing prevention traceable synchronous measuring tape double-light-source laser ranging device and method solves the problems that superlong wavelengths and ultrashort wavelengths cannot be generated synchronously and laser tapes are incapable of performing direct tracing and have nonlinear periodic errors and frequency aliasing, and has the advantages of being high in measuring efficiency, precision, stability and practicality.

Description

technical field [0001] The invention belongs to phase laser measurement technology, and mainly relates to a phase laser distance measuring device and method. Background technique [0002] Large-scale measurement has attracted much attention in the development of large-scale precision machinery manufacturing, major scientific and technological projects, aerospace industry, shipbuilding industry and microelectronic equipment industry and other large-scale optical-mechanical-electrical integration equipment processing and manufacturing. It is an important basis for the processing and overall assembly of large parts in aerospace vehicles and giant ships. The quality of its measurement methods and equipment performance directly affect the quality of workpieces and assembly accuracy, which in turn affects the operating quality, performance and life of the entire set of equipment. The multi-ruler phase ranging method uses a group of measuring ruler wavelengths from large to small t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G01S11/12
CPCG01S11/12
Inventor 谭久彬杨宏兴胡鹏程
Owner HARBIN INST OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products