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Test machine used for voltage setting

A testing machine and voltage setting technology, applied in electronic circuit testing and other directions, can solve problems such as inconvenience, and achieve the effect of reducing area and cost

Active Publication Date: 2014-10-01
TEST RES INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] It can be seen that the above-mentioned existing structure obviously still has inconvenience and defects, and needs to be further improved.
In order to solve the above problems, related fields have tried their best to find a solution, but no applicable method has been developed for a long time.

Method used

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  • Test machine used for voltage setting
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  • Test machine used for voltage setting

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Embodiment Construction

[0019] In order to make the description of the present invention more detailed and complete, reference may be made to the attached drawings and various embodiments described below, and the same reference numerals in the drawings represent the same or similar elements. On the other hand, well-known elements and steps have not been described in the embodiments in order to avoid unnecessarily limiting the invention.

[0020] As used herein, "about", "approximately" or "approximately" is used to modify any quantity that may vary slightly, but such slight variations will not change its essence. Unless otherwise specified in the embodiments, it means that the error range of the numerical value modified by "about", "approximately" or "approximately" is generally allowed within 20%, preferably within 10%. Within , and more preferably within 5%.

[0021] The technical solution of the present invention is a testing machine for voltage setting, which can be applied to circuit testing or...

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PUM

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Abstract

A test machine used for voltage setting comprises a control unit and a filter circuit, wherein the control unit is electrically connected with the filter circuit; the control unit comprises a FPGA (Field Programmable Gate Array) for providing a pulse width modulation control signal; and the filter circuit is used for receiving the pulse width modulation control signal and outputting at least one DC voltage. The low-cost FPGA is used for setting voltages of a pin driver and a receiver in a Per Pin construction mode, and the cost of a pin card of the Per Pin construction is greatly reduced.

Description

【Technical field】 [0001] The present invention relates to an electronic device, and in particular to a test machine for voltage setting. 【Background technique】 [0002] At present, the pin card (Pin Card) of the testing machine is used to set the voltage of the pin driver and receiver (Pin Driver / Pin Receiver) (such as: Vih / Vterm / Voh / Vol) using a digital-to-analog conversion chip (DAC IC) setting, if the pin card (Pin Card) adopts the Per Group structure, that is, multiple pin drivers and receivers are formed into a group (Group), and this group is set to the same interface The pin driver and receiver voltage, so the required digital-to-analog conversion chips are not too many; if the pin card (Pin Card) adopts the Per Pin architecture, that is, the settings required for each pin driver and receiver The voltage (such as: Vih / Vterm / Voh / Vol) can be set independently, and the number of digital-to-analog conversion chips required will increase, so the cost on the pin card will ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
Inventor 陈信豪郭柏伸
Owner TEST RES INC