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Test system and method

A test system and test method technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of manpower consumption, difficult to reduce product cost, long time, etc., and achieve the effect of shortening test time and improving work efficiency

Inactive Publication Date: 2014-10-01
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Testing electronic equipment through manual input not only consumes manpower, but also takes a long time, which is not conducive to the improvement of production efficiency and automation of the production process, and it is difficult to reduce product costs

Method used

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  • Test system and method

Examples

Experimental program
Comparison scheme
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Embodiment Construction

[0020] Please see figure 1 , the testing system 100 can automatically acquire the performance parameters of various items of electronic equipment such as CD player, computer, etc., and test the electronic equipment according to the acquired performance parameters. In this embodiment, the test system 100 is used to test the optical disc playback device 200 to determine whether it operates normally. The test system 100 includes a storage unit 10 , an input unit 20 , a display unit 30 , a test form editing unit 40 , a detection unit 50 , an identification number acquisition unit 60 , a parameter value acquisition unit 70 , a judgment unit 80 and a control unit 90 .

[0021] The storage unit 10 is used for storing a test table, wherein the test table includes at least one test item and a reference value corresponding to each test item. Wherein, the test form may be in the form of Excel (one of the components of Microsoft office, Microsoft office software), or in the form of a dat...

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Abstract

The invention discloses a test system used for testing the performance of electronic equipment. The test system comprises a storage unit and a display unit, wherein the storage unit is used for storing a test form, and the test form is used for recording at least one test item and a reference value corresponding to each test item. The test system also comprises a parameter value acquisition unit, a judgment unit and a control unit, wherein the parameter value acquisition unit is used for acquiring a corresponding parameter value of the electronic equipment according to the test item recorded by the test form; the judgment unit is used for judging whether the acquired parameter value is matched with the reference value of the corresponding test item or not; and the control unit is used for controlling the display unit to display the test item of the electronic equipment, the parameter value corresponding to the test item and a judgment result. The invention also provides a test method.

Description

technical field [0001] The invention relates to a test system and method, in particular to a test system and method for automatically acquiring multiple performance parameters of electronic equipment. Background technique [0002] In the current production process of electronic equipment, it is often necessary to obtain various parameters of the electronic equipment and judge whether the parameters are qualified, so as to test whether the electronic equipment works normally. However, the current testing process is relatively cumbersome, requiring the user to input corresponding test items in sequence and make parameter judgments. Taking the optical disc player as an example, when it is necessary to test the reading size of the optical disc player, the user needs to first input the reading size test item to control the test device to obtain the disc size, and then the user judges the acquired parameters (such as the disc size). Size) is within the normal specification range,...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/00
CPCG01N35/00G01R31/00G06F11/22
Inventor 李冬焱周兵
Owner HONG FU JIN PRECISION IND (SHENZHEN) CO LTD