A non-uniform correction method for sub-pixel images in multi-line time-of-flight scanning

A non-uniform correction and sub-pixel technology, applied in the field of image processing, can solve problems such as multi-line image non-uniformity, achieve the effect of improving accuracy and reducing gray scale difference

Active Publication Date: 2017-03-15
CHINA ACADEMY OF SPACE TECHNOLOGY
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to provide a non-uniformity correction method suitable for multi-line sequence time-difference scanning sub-pixel synthetic images, to solve the problem of non-uniformity of multi-line sequence images, and to eliminate the overall gray level between line sequence images Difference

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A non-uniform correction method for sub-pixel images in multi-line time-of-flight scanning
  • A non-uniform correction method for sub-pixel images in multi-line time-of-flight scanning
  • A non-uniform correction method for sub-pixel images in multi-line time-of-flight scanning

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0025] The present invention will be described in detail below in conjunction with the accompanying drawings and examples. A method for correcting non-uniformity of a multi-line time-lapse scanning sub-pixel image, the steps are as follows:

[0026] (1) Construct a multi-line time-difference scanning detection device, which includes an optical system 1, a scanning mechanism 2 and a multi-line detector 3; the scanning structure includes a pendulum mirror and a driving shaft thereof; the multi-line detection The detector is a two-line array detector, and the line array detector adopts N t The instantaneous field of view corresponding to the pixel is IFOV. Two adjacent detection arrays are arranged in parallel and staggered by 1 / N in the vertical scanning direction. t pixels, and set the detection array to sample S in the scanning direction and within a sampling length t times; the sampling length is the instantaneous field of view corresponding to the pixel; the scanning angul...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a method for conducting non-uniformity correction on sub-pixel images through multi-linear-array time difference scanning. The method includes the steps that (1) a multi-linear-array time difference scanning detection device is constructed; (2) each linear array detector conducts scanning imaging in the scanning direction according to a sampling interval, Nt groups of image data are obtained through each time of imaging, and the step (3) is conducted immediately; (3) the Nt groups of image data of each linear array detector are processed to form a frame detection image; (4) the frame detection images are spliced to obtain the two sub-pixel images; (5) cross splicing is conducted on the two sub-pixel images according to columns to form an image Ip1; (6) an image Ip2 processed through column-wise non-uniformity correction is obtained; (7) two sub-pixel images processed through column-wise non-uniformity correction are rebuilt; (8) the two sub-pixel images are rotated by 90 degrees in the same direction to obtain an image Ip3; (9) two sub-pixel images processed through line-direction non-uniformity correction are rebuilt; (10) the two sub-pixel images are rotated by 90 degrees in the reverse directions.

Description

technical field [0001] The invention belongs to the field of image processing, and relates to a non-uniform correction method for multi-line time-difference scanning sub-pixel images. Background technique [0002] The application of remote sensing images is becoming more and more widespread, but due to the influence of comprehensive factors such as the detector itself, process conditions, and external input, the output responsivity of each detector element is not completely consistent, and it appears as regular bands on the image and blind elements, that is, non-uniformity phenomena. The appearance of non-uniformity has a great impact on image quality, which in turn affects subsequent image applications. Therefore, the non-uniformity of the detector has always been one of the important problems to be solved in the imaging system. Generally, multinomial fitting method, statistical method and other methods are used for non-uniformity correction to eliminate or weaken the non...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G06T5/00
Inventor 孙晓峰王世涛宋鹏飞高宏霞
Owner CHINA ACADEMY OF SPACE TECHNOLOGY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap