Pantograph measuring method and pantograph measuring device

Abstract

A pantograph measurement method by means of image processing comprising a process (S1) for acquiring a video image of a marker (50) disposed on a pantograph (40) and for generating a space-time image from the acquired video, and a process (S2) for searching for the marker (50) by comparing the search patterns in accordance with the height of the space-time image, wherein: the marker (50) has a stripe pattern in which a first region (51) that cannot easily reflect light and a second region (52) that can easily reflect light are alternately disposed, at least two second regions (52) are disposed, and the stripe width of the second regions are different from one another; and the search pattern corresponds to the stripe pattern of the marker.

Description

technical field [0001] The present invention relates to a pantograph measuring method for measuring a pantograph by image processing and a pantograph measuring device based on the method. Background technique [0002] There are overhead lines as equipment for electrified railways, but the overhead lines must be erected within the specified height from the track surface. [0003] Therefore, it is necessary to manage whether or not the height of the trolley wire falls within the management value so as not to be affected by long-term changes or vehicle dynamic factors. At this time, since the height of the trolley line is equal to the height of the pantograph, it is managed instead by the height of the pantograph. A pantograph is one of current collectors installed on the roof of an electrified railway vehicle. [0004] In addition, if the pantograph vibrates downward with a large acceleration during operation, the pantograph and the trolley line are separated, and the trolle...

AI Technical Summary

Problems solved by technology

Therefore, although the laser sensor can measure the position of the pantograph (low frequency component), it is not suitable for the measurement of acceleration (high frequency component).

[0013] 2. The light section sensor cannot measure during the day

[0018] 4. The image processing method has the problem that the calculation process becomes huge when the measurement time is long and the number of frames per unit time is large.

[0020] However, in this way, if Figure 8 As shown, when a structure with specular luster passes over the mark, there is a possibility of misrecognition between two marks, the real mark reflected in the image captured by the camera, and the mark reflected by the specular surface.

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