Two-value image connected domain marking algorithm based on AOI bullet apparent defect detecting system
A connected domain labeling, binary image technology, applied in computing, computer parts, instruments, etc., can solve problems affecting algorithm speed, time-consuming, different, etc., to achieve prominent substantive features, huge speed improvement, and improved computing efficiency Effect
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[0044] The binary image connected domain marking algorithm of the AOI-based bullet apparent defect detection system includes the following steps:
[0045] (1) Obtain the original grayscale image of the bullet surface through the AOI system; this process is relatively mature in AOI technology, and will not be described in this embodiment;
[0046] (2) Carry out binary segmentation on the original grayscale image to obtain the binary image of the bullet surface; wherein, the method of determining the segmentation threshold value during binary segmentation can be the iterative method, or the maximum inter-class variance method, or Other methods, because the present invention does not relate to the improvement of this process, so this is not limited in this embodiment;
[0047](3) Scan the binary image in order from left to right and from top to bottom, and make preliminary marks; specifically, the processing process is as follows:
[0048] (3a) Scan the gray value of the pixel i...
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