An optical microscopic stress measurement device based on the principle of aperture deformation
An optical microscope and measuring device technology, which is applied to measuring devices, using optical devices, and measuring the force of change in optical properties of materials when they are under stress, can solve the problem of difficulty in achieving breakthroughs in kilometer test depths and hindering applications. , The stress relief method is complicated in the testing process, and it achieves significant scientific significance and economic and practical value, the requirements of the test environment are reduced, and the reliability and application range are improved.
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[0045] Below in conjunction with accompanying drawing and implementation example the present invention is further described:
[0046] like Figure 1~4 As shown, an optical microscopic stress measurement device based on the principle of aperture deformation includes a multi-stylus measurement component 1 and an optical microscopic imaging component 2 . The multi-stylus measuring component 1 and the optical microscopic imaging component 2 are connected into one body through a threaded button 3 .
[0047] The multi-probe measurement component 1 includes a stylus 11 , a spring 12 , a limit card 13 , a balance weight 15 , a housing 16 and a bottom cover 17 . The contact pins 11 are in pairs, and the number is not less than three pairs; the contact pins 11 are symmetrically arranged and located on the same cross-section in the housing 16;
[0048] The stylus 11 includes a contact 111, a stylus 113, a stylus spring rod 114 and a stylus tip 112 connected in sequence, the stylus 111 ...
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