The application provides a broadcast multi-board parallel test method,
system, medium and product, relates to the electronic manufacturing board test technical field, and the method comprises the following steps: a broadcast test instruction makes a plurality of to-be-tested boards start executing target test items at the same time. An initial token frame address
list to be collected establishes an ordered mechanism for board access, and a first
data segment provides a unified data collection space. In a token frame transmission operation, the first to-be-tested board executes differentiated token frame
processing operations according to its own test state: in an unfinished state, the token frame is directly forwarded; in a completed state, test completion result data is written into the first
data segment and the address
list to be collected is updated. This makes the boards that have completed the test automatically exit the loop, and the boards that have not completed the test continue to participate in token transmission until the address
list to be collected is empty, and the test results of all the boards are collected into the first token frame. In this way, the technical problem of low time utilization efficiency in the multi-board parallel test process in the prior art is solved.