13results about How to "Avoid duplication of tests" patented technology

The invention discloses a failure mode analysis system and method applied to a DRAM (Dynamic Random Access Memory), and relates to the technical field of semiconductors. The method comprises the steps of obtaining test resources by preparing a test environment; carrying out a frequency reduction test on the DRAM chip and the circuit board with problems, observing whether the DRAM chip and the circuit board are improved or not, and if the DRAM chip and the circuit board are improved, carrying out adaptation through soft modification or hard modification; if the frequency reduction test is not improved, signal integrity measurement is carried out, possible signal problems are searched, and the compatibility problem is solved by adjusting time sequence parameters; performing a special configuration test, verifying the influence of the special configuration, and performing adaptation according to a test result; and carrying out compatibility adaptation through soft modification or hard modification according to the test result. According to the method, the reasons of the adaptation compatibility failure can be quickly and effectively found, the adaptation problem is improved, the verification analysis time occupied by anomaly analysis is greatly shortened, and the matching degree of compatibility adaptation of the DRAM chip and the SOC platform on the market is improved.

The invention relates to a system testing method and device, computer equipment, a computer readable storage medium and a computer program product. The method comprises the following steps: in the process of executing each test case of the distributed system, obtaining a call tree and a coverage rate of the test case, obtaining a case weight corresponding to the test case according to the coverage rate, clustering all the test cases according to the call tree to obtain multiple groups of clusters, and sending the multiple groups of clusters to the distributed system; and determining a test priority corresponding to each test case under each group of clusters according to the case weight, and carrying out regression testing on the distributed system based on the test priorities. By adopting the method, the distributed system can be tested more comprehensively and specifically, and the test time and resources are saved, so that the stability and reliability of the system are ensured.

The invention provides an automatic driving test scene set evaluation method and device, electronic equipment and a storage medium, and the method comprises the steps: inputting a design operation condition and a test scene set into a natural language processing network layer of a test scene set evaluation model, and carrying out the semantic similarity calculation processing of the design operation condition and the test scene set, determining a mapping result between each test scene and a design operation condition; inputting a mapping result between each test scene and the design operation condition into a data processing network layer of the test scene set evaluation model, and calculating the coverage of the test scene set to the design operation condition and the redundancy of the test scene set based on the mapping result; and outputting the coverage and redundancy of the test scene set. According to the method, the coverage and the redundancy are realized, and quantitative evaluation on the quality of the test scene set is provided, so that resource allocation is optimized, unnecessary repeated tests are avoided, and the safety verification process of the automatic driving system is remarkably optimized.

The application provides a broadcast multi-board parallel test method, system, medium and product, relates to the electronic manufacturing board test technical field, and the method comprises the following steps: a broadcast test instruction makes a plurality of to-be-tested boards start executing target test items at the same time. An initial token frame address list to be collected establishes an ordered mechanism for board access, and a first data segment provides a unified data collection space. In a token frame transmission operation, the first to-be-tested board executes differentiated token frame processing operations according to its own test state: in an unfinished state, the token frame is directly forwarded; in a completed state, test completion result data is written into the first data segment and the address list to be collected is updated. This makes the boards that have completed the test automatically exit the loop, and the boards that have not completed the test continue to participate in token transmission until the address list to be collected is empty, and the test results of all the boards are collected into the first token frame. In this way, the technical problem of low time utilization efficiency in the multi-board parallel test process in the prior art is solved.

The present invention belongs to the field of memory test technology, and discloses an insertion state detection module and method for memory stick plug-in test, wherein the insertion state detection module is integrated on a memory stick plug-in test mainboard, and a memory slot is provided on the memory stick plug-in test mainboard, and the insertion state detection module comprises: two groups of detection contact groups, both of which are arranged in the memory slot, each group of detection contact groups comprises two detection contacts, and the two detection contacts of each group are of a normally closed structure; a detection unit, and the two detection contacts of each group are electrically connected to the detection unit, and are used to judge the opening and closing state of the two detection contacts of each group, and display the opening and closing state of the two detection contacts of each group. When executing the test task, the present invention can understand whether the contact between the memory stick and the memory slot is good, eliminate the failure caused by poor contact, and greatly improve the pass rate; it can avoid repeated testing, and save a lot of repeated testing time cost.

The invention relates to a test case optimization method and device and a storage medium. The test case optimization method comprises the following steps: acquiring a plurality of test cases; a code file corresponding to the test case is determined, the code file comprises at least one probe, and the probe is used for indicating whether a code associated with the probe in the code file is executed or not; generating a probe sequence corresponding to the test case based on the code file; based on the probe sequences corresponding to any two test cases, determining the relevancy between the any two test cases; and in response to the condition that the relevancy is greater than or equal to a relevancy threshold value, optimizing the any two test cases. The optimized test case can avoid repeated testing, the testing efficiency is improved, and the testing cost is saved.

The application provides a kind of traversal test method and device based on multi-agent, it is related to page test technical field, method includes: in response to the test instruction for target application, the hierarchical screen queue of target application is acquired and the visited screen set is constructed;Each depth queue in D depth queue in hierarchical screen queue is in turn as target depth queue, and each candidate test screen in target depth queue is in turn as target test screen;According to the image content of target test screen, the first screen identification code of target test screen is generated;In the absence of first screen identification code in visited screen set, a plurality of agents are called to execute single-screen test operation on target test screen, and the target test result corresponding to target test screen is obtained;According to the target test result corresponding to each candidate test screen in hierarchical screen queue, the test report of target application is generated.

The invention provides a mass parallel EMS robustness verification method and system for Internet of Things equipment, and belongs to the technical field of the Internet of Things equipment, and the method specifically comprises the steps: carrying out the robustness verification processing according to the robustness verification processing results in different number intervals, and combining the combination data of the Internet of Things equipment which carries out the robustness verification processing in the number intervals, determining an optimization target number interval in the number interval, and determining a verification number interval in the number interval based on the optimization target number interval data and in combination with coincident data of the equipment combination of the operating access Internet of Things equipment in the number interval and different optimization target number intervals, and the reliability of the verification processing of the robustness is improved.

The invention discloses a waterproof roll tension test result prediction method and system, and relates to the technical field of building material tests.The method comprises the steps that material data and production process data of a waterproof roll to be tested are imported into a prediction system, and a simulation test environment is configured in a configuration file of the prediction system; the prediction system processes the imported data into a format which can be identified by a waterproof roll tension test result prediction model based on a format conversion function; according to the configured simulation test environment, initializing super parameters of a waterproof roll tension test result prediction model, inputting processed import data into the model, and outputting a prediction result; explaining the output prediction result as a waterproof roll tension test result report; and adjusting and optimizing the waterproof roll tension test result prediction model regularly based on the real tension test record. Materials possibly meeting requirements can be rapidly screened out, the material screening and testing time is greatly shortened, and the decision-making efficiency is improved.

The invention provides a finished product test method, test equipment and test system of a chip and a storage medium. The testing method comprises the following steps: reading a unique identification code of a to-be-tested chip, and judging whether the unique identification code of the to-be-tested chip is wrong or not; after a plurality of electrical physical tests are carried out on the to-be-tested chip, a chip mark test is carried out, and whether the to-be-tested chip passes the electrical physical tests and the chip mark test is judged; after a plurality of electrical physical tests and chip mark tests of the to-be-tested chip all pass the tests, if the unique identification code is correct, outputting unique identification code information of the to-be-tested chip; otherwise, outputting unique identification code writing error information of the to-be-tested chip; and if the to-be-tested chip fails to reach the predetermined standard in any electrical physical test and / or chip mark test, outputting electrical error information that the to-be-tested chip fails to pass the test in a classified manner. By means of the method, the real failure reason of each chip can be determined, and the stacked material detection function of the chips can be reserved.

This utility model relates to the field of bridge engineering, specifically a test device for the assembly tolerance of bridge expansion joints. It includes a support platform, slider, limiting plate, L-shaped clamp, servo motor, bidirectional screw, sliding block, support frame, hydraulic rod, pressure plate, mounting plate, pressure device, and slide groove, among other structures. Using this utility model can significantly improve testing efficiency, quickly complete a large number of expansion joint inspections, and meet the high-efficiency requirements for expansion joint quality inspection in modern bridge construction and maintenance.

The invention relates to the technical field of substations, in particular to an IED (Intelligent Electronic Device) connection test method, which comprises the following steps of: selecting a boundary range for testing rebuilt and expanded equipment from a rebuilt and expanded SCD (Substation Configuration Description) file; determining central IED equipment and associated IED equipment in the selected boundary range, and determining virtual IED equipment and entity IED equipment according to the importance degrees of the central IED equipment and the associated IED equipment; in response to the fact that the number of the entity IED devices is smaller than a set value, the virtual IED devices are simulated through the first virtual machine, and connection is established between the first virtual machine and the entity IED devices; and performing a transmission test on the first virtual machine and the entity IED to determine the correctness of the virtual connection relationship. According to the scheme, the accuracy of the measurement result is effectively improved, the test method can be applied to various intelligent substation environments, and the applicability of the IED virtual connection test method is improved.

The invention discloses a gateway host adaptive closed-loop test method and system based on intelligent plan driving, and aims to solve the problems of rigid test process, low efficiency and weak traceability of the existing gateway machine. The core of the technical scheme is to construct a complete closed loop of'plan editing-automatic matching-batch asynchronous testing-intelligent retesting-data tracing '; a multi-level tree structure including equipment types, hardware models and the like is adopted to manage a test plan, a time consumption threshold can be customized to distinguish common / asynchronous cases, and parallel execution is realized; configuration of retest times is supported, and only failed use cases are accurately retested; a structured report associated with the unique detection order number is generated, and full-process tracing is achieved. The system comprises a test plan management core module and the like, and an optional authority management module distinguishes administrator authority from common user authority. The test flexibility and universality are improved, the test time is remarkably shortened, the operation threshold is reduced, and a reliable automatic test scheme is provided for links such as gateway machine production quality inspection and factory acceptance.