Chip test system and method

Abstract

The invention discloses a chip test system which includes a tester, a controller and a memory. The tester transmits the ID data of a chip under test to the controller. The controller sends an ID reading control signal to the tester, and receives the ID data of the chip under test transmitted by the tester and converts the ID data into binary data. The controller acquires a corresponding memory address according to the binary data, and acquires test state information stored in the memory address. If the test state information stored in the memory address is an untested data marker, the controller determines that the chip under test has not been tested. If the test state information stored in the memory address is a tested data marker, the controller determines that the chip under test has been tested. The memory stores the test state information of the chip under test. Whether the ID of the chip under test repeats can be determined. A function of anti-repeated-code test is achieved. Repeated test of chips can be prevented. The invention further discloses a chip test method.

Description

technical field [0001] The invention relates to the field of chip testing, in particular to a chip testing system and a method thereof. Background technique [0002] With the rapid development of science and technology, chips are widely used due to their superior performance such as small size, reliable and convenient data recording, such as setting identification chips on second-generation ID cards, setting bank card cores on bank cards, etc. [0003] In the prior art, the ID is usually used to uniquely identify the chip. When testing the chip, the testing instrument only tests whether the functions of the chip are normal, and does not record the ID of the tested chip. Therefore, when a chip with the same ID appears At the same time, the existing testing equipment cannot test out, and it is prone to repeated ID codes, which will undoubtedly have a great impact on the subsequent use and safety performance of the chip; at the same time, it is also prone to repeated testing of...

AI Technical Summary

Problems solved by technology

[0003] In the prior art, the ID is usually used to uniquely identify the chip. When testing the chip, the testing instrument only tests whether the functions of the chip are normal, and does not record the ID of the tested chip. Therefore, when a chip with the same ID appears At the same time, the existing testing equipment cannot be tested, and the situation of repeated ID codes is prone to occur, which will undoubtedly have a great impact on the subsequent use and safety performance of the chip; at the same time, it is also prone to repeated testing of the chip, which affects the test efficiency.

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