Test method for the combination of ground and on-orbit life of aerospace components
A technology for test testing and device life, applied in the direction of instruments, measuring electricity, measuring devices, etc., can solve problems such as limitations, inability to achieve lifespan, etc., and achieve comprehensive results.
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Embodiment 1
[0053] Test method for ground and on-orbit lifetime integration test of power devices
[0054] The first step is to conduct a ground accelerated life test, which includes the following steps:
[0055] Step 1, determine the acceleration factor of the acceleration test of the power device.
[0056] The acceleration factor is the factor that accelerates the life loss of the device. For power devices, increasing the acceleration factor of the life test ensures that the device can reach the final stage of the "bathtub curve" and enter the loss period.
[0057] Such as image 3 As shown, "bathtub curve" refers to the curve in which the failure rate of general products including components changes with the life cycle, which has three stages: early failure period, usable life period, and wear-out period (ie, the end of life).
[0058]Step 1.1 Select a GaAs microwave power device. The gate metal structure of GaAs microwave power devices adopts Au / Pt / Ti structure, and the mutual diff...
Embodiment 2
[0112] Test method for ground and on-orbit lifetime integration test of non-power devices
[0113] The first step is to conduct a ground accelerated life test, which includes the following steps:
[0114] Step 1, determine the accelerated stress of the accelerated test of non-power devices.
[0115] For non-power devices, taking bipolar operational amplifier devices as an example, the accelerating stress is temperature.
[0116] Step 2. Build an accelerated life test platform and select possible sensitive parameters.
[0117] Step 3, conduct ground accelerated life test to determine sensitive parameters.
[0118] The combination of ground and on-orbit is carried out through the early failure stage of the "bathtub curve". In this case, it is limited by the on-orbit test samples. Due to the limited on-orbit test samples (generally only 1 to 2), the probability of complete failure of the device It is almost 0, which can only be reflected by the change of sensitive parameters o...
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