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Test method for the combination of ground and on-orbit life of aerospace components

A technology for test testing and device life, applied in the direction of instruments, measuring electricity, measuring devices, etc., can solve problems such as limitations, inability to achieve lifespan, etc., and achieve comprehensive results.

Active Publication Date: 2017-03-15
CHINA ACADEMY OF SPACE TECHNOLOGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] At present, the reliability prediction mathematical model in the application standard can predict the reliability / life of key components, but this reliability prediction method has limitations
During the assessment test of the quality assurance process of model components, it was found that some components could not achieve their claimed life under certain environmental conditions. Facing the actual situation, it is urgent to develop more effective reliability testing methods

Method used

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  • Test method for the combination of ground and on-orbit life of aerospace components
  • Test method for the combination of ground and on-orbit life of aerospace components
  • Test method for the combination of ground and on-orbit life of aerospace components

Examples

Experimental program
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Effect test

Embodiment 1

[0053] Test method for ground and on-orbit lifetime integration test of power devices

[0054] The first step is to conduct a ground accelerated life test, which includes the following steps:

[0055] Step 1, determine the acceleration factor of the acceleration test of the power device.

[0056] The acceleration factor is the factor that accelerates the life loss of the device. For power devices, increasing the acceleration factor of the life test ensures that the device can reach the final stage of the "bathtub curve" and enter the loss period.

[0057] Such as image 3 As shown, "bathtub curve" refers to the curve in which the failure rate of general products including components changes with the life cycle, which has three stages: early failure period, usable life period, and wear-out period (ie, the end of life).

[0058]Step 1.1 Select a GaAs microwave power device. The gate metal structure of GaAs microwave power devices adopts Au / Pt / Ti structure, and the mutual diff...

Embodiment 2

[0112] Test method for ground and on-orbit lifetime integration test of non-power devices

[0113] The first step is to conduct a ground accelerated life test, which includes the following steps:

[0114] Step 1, determine the accelerated stress of the accelerated test of non-power devices.

[0115] For non-power devices, taking bipolar operational amplifier devices as an example, the accelerating stress is temperature.

[0116] Step 2. Build an accelerated life test platform and select possible sensitive parameters.

[0117] Step 3, conduct ground accelerated life test to determine sensitive parameters.

[0118] The combination of ground and on-orbit is carried out through the early failure stage of the "bathtub curve". In this case, it is limited by the on-orbit test samples. Due to the limited on-orbit test samples (generally only 1 to 2), the probability of complete failure of the device It is almost 0, which can only be reflected by the change of sensitive parameters o...

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Abstract

An aerospace component ground and ontrack service life associativity test evaluation method is characterized by comprising the following steps that a ground accelerated life test is carried out, acceleration factors, for accelerating the test, of a power device are determined, a GaAs microwave power device is selected, the junction temperature is determined, an accelerated life test platform is built, the test time, test parameters and test conditions are set, ground accelerated life tests are carried out at the same time under the different acceleration factors, data processing is carried out according to a Weibull graph estimation method, the service life is prolonged, an ontrack test is carried out, ontrack test samples are selected, loaded to an airplane for flight and monitored in an ontrack mode, changes of the direct current parameters and microwave parameters of the ontrack test samples are monitored in real time, and the parametric variation trend and the variable quantity of the GaAs microwave power device are observed on a time axis; parameter degeneration of the GaAs microwave power device is predicted according to parameter changes, the service life is prolonged, and the level of the service life of the device is predicted.

Description

technical field [0001] The invention belongs to the technical field of component testing and testing, and in particular relates to a testing method for combining ground and on-orbit service life of aerospace components. Background technique [0002] Some of the key components selected in the spacecraft design have no long-life application experience, and there is a lack of information on the failure rate and reliability of their space applications, and there are certain reliability risks. In addition, the ability to accurately test the reliability level of its components and predict the failure rate directly affects the prediction and testing of the reliability of the model product. [0003] At present, the reliability prediction mathematical model in the application standard can predict the reliability / life of key components, but this method of reliability prediction has limitations. In the assessment test of the quality assurance process of model components, it was found ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
Inventor 韩晓东高媛王文炎冯亚林张洪伟
Owner CHINA ACADEMY OF SPACE TECHNOLOGY