Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Device and method for measuring microwave surface resistance distribution of high temperature superconducting thin film

A technology of microwave surface resistance and high-temperature superconducting thin film, which is applied in the field of superconducting electronics, can solve the problems of resolution, sensitivity and versatility, achieve high test resolution and sensitivity, avoid direct coupling, and reduce difficulty Effect

Active Publication Date: 2017-01-25
UNIV OF ELECTRONICS SCI & TECH OF CHINA
View PDF1 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] The purpose of the present invention is to solve the problem that the resolution, sensitivity and versatility of the existing superconducting thin film microwave surface resistance distribution test method cannot be balanced, and a dielectric resonator test device using a metal ring to converge the electromagnetic field is constructed, and provides A new test method to make it widely used in my country's superconducting electronics industry

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Device and method for measuring microwave surface resistance distribution of high temperature superconducting thin film
  • Device and method for measuring microwave surface resistance distribution of high temperature superconducting thin film
  • Device and method for measuring microwave surface resistance distribution of high temperature superconducting thin film

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0039] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with specific examples.

[0040] The high-temperature superconducting thin film microwave surface resistance distribution test device provided in this embodiment includes a test seat 1 , a fixing component, a calibration component and a sealing cover 5 .

[0041] The schematic diagram of the test socket 1 is as follows: figure 2 As shown, it includes a shielding case 6 , an input coupling structure 8 , an output coupling structure 9 , a support ring 10 , a dielectric post 11 and a metal ring 12 . The dielectric column 11 is fixed on the support ring 10 and then fixed in the shielding shell 6. The metal ring 12 is embedded on the inner wall of the shielding shell 6. The thickness of the metal ring 12 ranges from 0.1mm to 0.5mm, and its inner diameter is slightly larger than The diameter of the me...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a high-temperature superconducting film microwave surface resistance distribution test device and method. The test device includes a test seat, a fixed component, a calibration component and a sealing cover, and its working resonance mode is TE012. The test socket includes a shielding shell, an input coupling structure, an output coupling structure, a support ring, a dielectric column and a metal ring. The test seat loads the tested superconducting film to form a resonator, the fixing component is used to fix the tested superconducting film, and the sealing cover is used to isolate the inside and outside of the resonator. The beneficial effects of the present invention are: (1) solve the contradiction between the resolution, sensitivity and versatility of the test device in the microwave surface resistance distribution test of the superconducting thin film; (2) effectively prevent the superconducting thin film to be tested from being (3) It can effectively avoid direct coupling and has high test accuracy.

Description

technical field [0001] The invention belongs to the technical field of superconducting electronics, and in particular relates to the design of a high-temperature superconducting film microwave surface resistance distribution testing device and method. Background technique [0002] The microwave surface resistance of high-temperature superconducting films in the liquid nitrogen temperature zone is 2-3 orders of magnitude lower than that of conventional good conductors. This low-loss characteristic makes high-temperature superconducting microwave passive devices based on high-temperature superconducting films have Excellent characteristics that cannot be compared with conventional devices. According to the structural characteristics of the high-temperature superconducting film itself, its microwave surface resistance is not uniform. As the circuit of superconducting devices becomes more and more complex, the consistency of superconducting film materials becomes increasingly pr...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/02
Inventor 曾成补世荣宁俊松陈柳张其劭
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com