High-temperature test system and test method for complex dielectric constant in an oxygen-poor environment

A complex permittivity and testing system technology, which is applied in measuring devices, measuring electrical variables, measuring resistance/reactance/impedance, etc., can solve problems such as few researches and complex constitutive equations

Inactive Publication Date: 2017-08-25
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Its constitutive equation itself is very complicated, and there are not many studies in this area at home and abroad

Method used

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  • High-temperature test system and test method for complex dielectric constant in an oxygen-poor environment
  • High-temperature test system and test method for complex dielectric constant in an oxygen-poor environment
  • High-temperature test system and test method for complex dielectric constant in an oxygen-poor environment

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Embodiment Construction

[0046] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.

[0047] This embodiment provides a high-temperature test system for complex permittivity in an oxygen-poor environment, which is used to test complex permittivity using a cylindrical cavity perturbation method, including:

[0048] The test part includes a cylindrical resonant cavity 1, an air storage cylinder 10 above the cylindrical resonant cavity 1, a pressure detection gauge 15 connected to the air storage cylinder, and a vacuum pum...

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Abstract

The invention provides a high-temperature test system and test method for complex dielectric constant in an oxygen-poor environment. The test system includes: a test part, a pneumatic part, a sample guide part, a heating and cooling temperature control part, a concentration pressure and temperature control part, and the steps of the test method Including the resonant frequency and quality factor of the test cavity, put a rod-shaped sample, first evacuate the air storage cylinder, and then fill it with nitrogen and oxygen; turn on the induction heating equipment; when it is heated to the required temperature, turn on the pneumatic device immediately Quickly push the heated sample into the cylindrical resonant cavity through the metal support rod for testing; use the vector network analyzer to measure the resonant frequency and quality factor of the resonant cavity, and measure the dielectric constant and loss tangent of the sample; the invention can The dielectric properties of the material are tested at variable temperatures in an oxygen-poor environment; the heating power can be controlled through external induction heating equipment to achieve a test temperature above 1500°C and a test pressure of 0.02-0.1MPa.

Description

technical field [0001] The invention relates to the technical field of microwave and millimeter wave material dielectric property testing, in particular to a high-temperature testing system and testing method for complex dielectric constant in an oxygen-poor environment. Background technique [0002] With the development and application of communication systems, weapon precision guidance and electronic countermeasures technology, it is more and more important to accurately understand the dielectric properties of circuit dielectric substrate materials and radome materials. As the operating temperature and environment of these materials change, their dielectric properties change accordingly. [0003] In addition, as a new space for science and technology and military applications, adjacent space refers to the airspace 20-100km from the ground. In this space, the air content is quite thin and the corresponding pressure is relatively low. Therefore, the oxygen-poor environment i...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/26
Inventor 李恩常利坤张婧徐家帝郭高凤崔红玲李灿平
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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