System and method for high-temperature testing of complex permittivity in oxygen-deficient environment

A technology of complex permittivity and test system, which is applied in measurement devices, measurement of electrical variables, measurement of resistance/reactance/impedance, etc., and can solve problems such as few studies and complex constitutive equations

Inactive Publication Date: 2015-02-18
UNIV OF ELECTRONIC SCI & TECH OF CHINA
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  • Abstract
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Problems solved by technology

Its constitutive equation itself is very complicated, and

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  • System and method for high-temperature testing of complex permittivity in oxygen-deficient environment
  • System and method for high-temperature testing of complex permittivity in oxygen-deficient environment
  • System and method for high-temperature testing of complex permittivity in oxygen-deficient environment

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Embodiment Construction

[0046] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.

[0047] This embodiment provides a high-temperature test system for complex permittivity in an oxygen-poor environment, which is used to test complex permittivity using a cylindrical cavity perturbation method, including:

[0048] The test part includes a cylindrical resonant cavity 1, an air storage cylinder 10 above the cylindrical resonant cavity 1, a pressure detection gauge 15 connected to the air storage cylinder, and a vacuum pum...

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Abstract

The invention provides a system and method for high-temperature testing of complex permittivity in an oxygen-deficient environment. The system comprises a testing portion, a pneumatic portion, a sample guiding portion, a heating and cooling temperature control portion and a concentration pressure and temperature control portion. The method comprises the steps that the resonant frequency and the quality factor of a cavity are tested, a rod-shaped sample is placed in the cavity, vacuumizing is conducted on a reservoir firstly, and after vacuumizing, nitrogen and oxygen are fed into the reservoir; an induction heating device is started; when the temperature is raised to a needed temperature through heating, the pneumatic device is started instantly, the heated sample is rapidly ejected into a cylinder resonant cavity through a metal supporting rod, and testing is conducted; the resonant frequency and the quality factor of the resonant cavity and the complex permittivity and the loss tangent value of the sample are tested through a vector network analyzer. By the adoption of the system and method for high-temperature testing of complex permittivity in the oxygen-deficient environment, variable-temperature testing can be conducted on the dielectric property of a material in the oxygen-deficient environment, the heating power can be controlled through the external induction heating device, the testing temperature is higher than 1500 DEG C, and the testing pressure ranges from 0.02 MPa to 0.1 Mpa.

Description

technical field [0001] The invention relates to the technical field of microwave and millimeter wave material dielectric property testing, in particular to a high-temperature testing system and testing method for complex dielectric constant in an oxygen-poor environment. Background technique [0002] With the development and application of communication systems, weapon precision guidance and electronic countermeasures technology, it is more and more important to accurately understand the dielectric properties of circuit dielectric substrate materials and radome materials. As the operating temperature and environment of these materials change, their dielectric properties change accordingly. [0003] In addition, as a new space for science and technology and military applications, adjacent space refers to the airspace 20-100km from the ground. In this space, the air content is quite thin and the corresponding pressure is relatively low. Therefore, the oxygen-poor environment i...

Claims

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Application Information

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IPC IPC(8): G01R27/26
Inventor 李恩常利坤张婧徐家帝郭高凤崔红玲李灿平
Owner UNIV OF ELECTRONIC SCI & TECH OF CHINA
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