A test circuit for a field effect tube

Abstract

The present invention relates to the technical field of device testing. The present invention provides a test circuit for field effect transistors. The test circuit includes a control circuit, a first test source, a first switching device, a second switching device and a third switching device. A controller controls the first A switch device, a second switch device and a third switch device are in a conduction state, so that the first test source, the gate of the field effect transistor, the first source test terminal, the second source test terminal, and the first drain test Terminal, the second drain test terminal and the ground form a measurement loop, and detect the voltage value of the measurement loop when the first test source outputs current, and test the contact impedance of the field effect transistor according to the voltage value and current value. The field effect tube can be tested through the test source and multiple switching devices. It is not necessary to use a special machine. As long as the corresponding current and voltage requirements of the corresponding field effect tube are met, the test can be carried out to improve the utilization rate of the test circuit. The effect tube test has strong versatility and reduces operating costs.

Description

technical field [0001] The invention relates to the technical field of device testing, in particular to a testing circuit for field effect transistors. Background technique [0002] At present, the test of FETs is mainly divided into two parts: DC test and AC test. Among them, the DC test of FETs mainly includes gate-source leakage (IGSS), drain-source leakage (IDSS), on-resistance (RDSON) and the test of parameters such as turn-on voltage (VTH), in the prior art, to the DC parameter test of FET, mainly adopt the special-purpose testing machine test of discrete device, as machines such as JUNO, ACCO 8002. One of the disadvantages of using a dedicated machine is that other IC products cannot be tested on this machine, resulting in poor versatility of the machine. In addition, for test factories facing fierce competition, if there is no field effect tube test, the machine will Therefore, the versatility and utilization of the machine are very important; in addition, the disad...

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Problems solved by technology

[0003] The purpose of the present invention is to provide a test circuit for field effect tubes, aiming at solving the problems that the special testing machine in the prior art cannot test the contact impedance of field effect tubes and the leakage test accuracy is low

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