Silicon core tube bending test device

Abstract

The invention provides a silicon core pipe bending test device which comprises a base, a back plate, a bending operation rod and a plurality of fixed wheels arranged on the back plate, wherein the base is fixedly connected with the back plate and is used for supporting; the cross section of the back plate is in a semicircular shape and has a first radius; a plurality of semicircular arc-shaped structures are formed by the plurality of fixed wheels arranged on the back plate, the centers of circles of the semicircular arc-shaped structures are coincided with the center of a circle of the back plate, and the radius of each semicircular arc-shaped structure is smaller than the first radius; the first end of the bending operation rod is connected at the position of the center of the circle of the back plate, and the bending operation rod can slide along the circumferential direction of the back plate around the position of the center of the circle of the back plate; the bending operation rod is also provided with guide wheels matched with the fixed wheels; when the bending operation rod slides along the circumferential direction of the back plate around the position of the center of the circle of the back plate, a space for clamping a silicon core pipe to be tested can be formed between each guide wheel and the corresponding fixed wheel; the fixed wheels and the guide wheels are respectively constructed to be rotating bodies, the rotating curves of the rotating bodies are semicircular arcs, and the centers of the circles of the semicircular arcs are far away from the axes of the rotating bodies.

Description

technical field [0001] The invention relates to the field of bending performance testing equipment, in particular to a silicon core tube bending testing device. Background technique [0002] According to the national standard of "High Density Polyethylene Silicon Core Tube", it is necessary to test the bending resistance of the silicon core tube, and the detection is realized by measuring the state of the silicon core tube after bending at low temperature. [0003] According to the current test procedure, it is necessary to take the sample out of the cryogenic device (-20°C ± 2°C), and complete the bending 180° test in 4 different directions within 40s. The bending state is U-shaped, and each bending test The time interval cannot exceed 20s. [0004] For this requirement, the existing cold bending test device generally adds several small disks on a large disk, and installs sample positioning grooves and bending positioning grooves on the edge of the small disks. The silico...

AI Technical Summary

Problems solved by technology

[0004] For this requirement, the existing cold bending test device generally adds several small disks on a large disk, and installs sample positioning grooves and bending positioning grooves on the edge of the small disks. The silicon core tube of the sample is manually pressed down to achieve bending, which is a complicated operation. In addition, in order to meet the test requirements, the entire test equipment is often made very high and large, which makes it very inconvenient to perform bending operations on a higher disc.

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