Defect size measurement device and method

A defect size and measuring device technology, applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of inconvenient measurement operation, low data accuracy, poor reliability, etc., and achieve convenient and flexible installation and measurement, high precision, and reduce The effect of instrument error

Inactive Publication Date: 2015-03-25
CENT RES INST OF BUILDING & CONSTR CO LTD MCC GRP +2
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Since the above-mentioned readings are done manually, problems such as instrument errors, installation errors, and operating errors cannot be avoided, and the obtained data has low precision and poor reliability; moreover, the steps in the above-mentioned detection process are relatively cumbersome , so it is not convenient to measure

Method used

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  • Defect size measurement device and method
  • Defect size measurement device and method
  • Defect size measurement device and method

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Embodiment Construction

[0032] In order to make the technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0033] figure 1 is a schematic diagram of the structure of the defect size measuring device in the embodiment of the present invention. like figure 1 As shown, the defect size measuring device in the embodiment of the present invention includes: a ruler body 11, a laser displacement sensor 12, and a data collector 13;

[0034] Both ends of the ruler body 11 are provided with support rods 14 perpendicular to the ruler body 11, the upper end of the ruler body 11 is provided with a linear guide rail 15 along the direction of extension of the ruler body, and the front of the ruler body 11 is provided with a plurality of Trigger knob 16 with preset intervals;

[0035] The laser displacement sensor 12 is slidably installed on the linear guide rail 1...

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Abstract

The invention provides a defect size measurement device and method. The defect size measurement device comprises a ruler body, a laser displacement sensor and a data acquisition unit, wherein supporting rods perpendicular to the ruler body are arranged at the two ends of the ruler body; the upper end of the ruler body is provided with a linear guide rail in the extending direction of the ruler body; the front face of the ruler body is provided with multiple trigger knobs at preset intervals; the laser displacement sensor is arranged on the linear guide rail in a sliding mode; when the laser displacement sensor slides to the trigger knobs on the ruler body, the laser displacement sensor is triggered to measure the vertical distance between the current location and the surface of an object to be measured; the data acquisition unit is connected with the laser displacement sensor and stores data obtained by measurement of the laser displacement sensor. By the application of the defect size measurement device and method, the instrument error, installation error and operation error can be reduced effectively, it is ensured that measurement data are real and accurate, precision is high, and reliability is high.

Description

technical field [0001] The present application relates to the field of civil engineering, in particular to a defect size measuring device and method. Background technique [0002] In the field of civil engineering, it is often necessary to measure the flatness of the surface of an object to be tested to confirm whether there is a defect on the surface or the position and size of the existing defect. For example, on the surface of the steel lining (steel plate) of the containment vessel of a nuclear power plant, defects such as bulges may appear, which will adversely affect the safety of the containment vessel. The position and size of the bulge are detected. [0003] Currently, in the prior art, a plurality of dial gauges or dial gauges are generally used to perform the above-mentioned detection process. During this detection process, multiple dial gauges or dial gauges need to be installed on the same support rod. When testing, slide the support bar on the surface of the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/00G01B11/30
Inventor 徐海翔赵文博李如源董月亮褚英杰杨刚蒋翔
Owner CENT RES INST OF BUILDING & CONSTR CO LTD MCC GRP
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