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Scattering parameter testing system and implementation method thereof

A technique for testing and implementing methods of scattering parameters, which is applied in measuring devices, measuring electrical variables, and measuring resistance/reactance/impedance, etc., can solve problems such as decreased accuracy of measurement results and poor stability of the test system, and achieves elimination of system errors, The effect of high measurement accuracy

Active Publication Date: 2015-04-15
SHANGHAI HOLLYWELL ELECTRONICS SYST TECH
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  • Application Information

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Problems solved by technology

[0009] The technical problem to be solved in this application is to provide a scattering parameter testing system, which can solve the problem of decreased accuracy of measurement results caused by the poor stability of the testing system during the long-term testing process

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  • Scattering parameter testing system and implementation method thereof
  • Scattering parameter testing system and implementation method thereof
  • Scattering parameter testing system and implementation method thereof

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Embodiment Construction

[0033] see Figure 4a and Figure 4b , which is the first embodiment of the scattering parameter testing system of the present application, used to measure the reflection coefficient. It includes a vector network analyzer, a waveguide switch and the DUT. The vector network analyzer uses only one port, e.g. figure 1 shown in the vector network analyzer. This port of the vector network analyzer is connected to one end of the waveguide switch. The other end of the waveguide switch is connected to the port under test of the device under test. The above connections are all realized by coaxial cables suitable for radio frequency signal transmission. If the DUT has other ports, the other ports are impedance matched (for example, connected to a 50 ohm resistor).

[0034] The waveguide switch has two states of short circuit and conduction. see Figure 5a , which is the short-circuit state of the waveguide switch, and the waveguide switch at this time is equivalent to a short ci...

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Abstract

The invention discloses a scattering parameter testing system. The scattering parameter testing system comprises a vector network analyzer, a waveguide switch and a device under test when used for measuring a reflection coefficient, wherein a first port of the vector network analyzer is connected with one end of the waveguide switch, the other end of the waveguide switch is connected with a port under test of the device under test, and the device under test has no other ports or has other ports in impedance matching. The scattering parameter testing system comprises the vector network analyzer, two waveguide switches and the device under test when used for measuring a transmission coefficient, wherein the first port of the vector network analyzer is connected with one end of the first waveguide switch, the other end of the first waveguide switch is connected with a first port of the device under test, a second port of the device under test is connected with one end of the second waveguide switch, and the device under test has no other ports or has other ports in impedance matching. A scattering parameter measurement method is implemented without system calibration and error correction. A testing process is performed in quasi real time, so that various system errors are eliminated, and quite high measurement precision is obtained.

Description

technical field [0001] The application relates to a scattering parameter testing system for radio frequency microwave circuits. Background technique [0002] In radio frequency microwave circuits, the traditional concepts of voltage and current are no longer applicable, and the reflection and transmission modes of electromagnetic waves must be used for analysis. Scattering parameters (also known as S parameters) are parameters based on the relationship between incident waves and reflected waves, and are especially suitable for describing the characteristics of radio frequency microwave circuits. Reflection coefficient (reflection coefficient) and transmission coefficient (transmission coefficient) are two kinds of scattering parameters. The former is used to represent the ratio of the electromagnetic wave reflection to the incident amount of each external port of the circuit, and the latter is used to represent an external port of the circuit. The ratio of the amount of ele...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/28
Inventor 周建华刘会来
Owner SHANGHAI HOLLYWELL ELECTRONICS SYST TECH