X-ray phase contrast imaging system, method and device based on photon counting

A photon counting and phase contrast imaging technology, applied in the field of radiation imaging, can solve the problems of low utilization rate of X-rays, insufficient ability to obtain information on sample material composition, limiting the practical application of grating phase contrast imaging technology, etc.

Active Publication Date: 2018-04-27
NANOVISION TECHNOLOGY (BEIJING) CO LTD
View PDF6 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in this technical scheme, the production of the grating is still a bottleneck, which will limit the practical application of the grating phase contrast imaging technology in medicine and industry.
[0006] In addition, most of the existing phase-contrast imaging systems use detectors based on energy integration, resulting in a low utilization rate of X-rays after penetrating the sample.
On the other hand, although the detector based on energy integration can obtain the structural information inside the sample, its ability to obtain the information of the sample material composition is insufficient.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • X-ray phase contrast imaging system, method and device based on photon counting
  • X-ray phase contrast imaging system, method and device based on photon counting
  • X-ray phase contrast imaging system, method and device based on photon counting

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0041] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0042] It is known from common sense in physics that the wavelength of X-rays is much shorter than that of visible light. The imaging of this special light source can obtain thousands of times the spatial resolution of an optical microscope. We can use this feature to solve the problem that traditional optical microscopes cannot distinguish nanoscale spatial structures. On the other hand, using nuclear electronics technology and semiconductor technology, we can artificially control the radiation spectrum of the X-ray source, and identify the energy carried by each single X-photon after penetrating the sample. This type of energy information can provide more sample information.

[0043]Under the guidance of the above technical ideas, the present invention uses photon counting technology, phase contrast imaging technology and three-di...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
wavelengthaaaaaaaaaa
Login to view more

Abstract

The invention discloses an X-ray phase contrast imaging system based on photon counting, and also discloses a method and key equipment for realizing X-ray phase contrast imaging by the system. In this system, the X-ray source emits X-rays to the sample on the scanning platform. When the X-ray penetrates the sample, it generates photons that carry the material characteristic information in the spatial position. The photon counting detector counts the photons on the imaging plane to obtain The projection data and energy data of incident photons are transmitted to the three-dimensional reconstruction system; the three-dimensional reconstruction system reconstructs the three-dimensional structure and material composition category inside the sample according to the projection data and energy data, and digitally dyes the components of the sample, so as to determine the material of the sample. ingredients are identified. The invention performs non-destructive detection of weakly absorbing substances through photon counting technology, phase contrast imaging technology and three-dimensional reconstruction technology, and can obtain digital wax blocks with energy discrimination ability and micron-level or nano-level spatial resolution ability.

Description

technical field [0001] The invention relates to an X-ray imaging system, in particular to an X-ray phase-contrast imaging system based on photon counting, and also relates to a method and key equipment for realizing X-ray phase-contrast imaging of the system, belonging to the technical field of radiation imaging. Background technique [0002] The X-ray imaging system detects the internal structure of an object based on the principle that substances absorb X-rays differently, that is, absorption contrast imaging. In practice, traditional X-ray imaging systems can clearly image substances composed of elements with large atomic numbers (such as human bones, etc.), while weakly absorbing substances composed of elements with small atomic numbers (such as carbon, hydrogen, and oxygen) (such as tissue blocks removed during surgery, cell masses taken out by needle biopsy, sediment after centrifugation of body fluids, etc.), etc., are blurred or even impossible to image. When detect...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/04G01N23/083
Inventor 曹红光李运祥郑海亮
Owner NANOVISION TECHNOLOGY (BEIJING) CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products