X-ray phase contrast imaging system based on photon counting, X-ray phase contrast imaging method realized by the system, and key equipment of X-ray phase contrast imaging method

A photon counting and phase-contrast imaging technology, applied in the field of radiation imaging, can solve the problems of limiting the practical application of grating phase-contrast imaging technology, insufficient ability to obtain sample material composition information, and low utilization rate of X-rays

Active Publication Date: 2015-04-29
NANOVISION TECHNOLOGY (BEIJING) CO LTD
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Problems solved by technology

However, in this technical scheme, the production of the grating is still a bottleneck, which will limit the practical application of the grating phase contrast imaging technology in medicine and industry.
[0006] In addition, most of the existing phase-contrast imaging systems use detectors based on energy integration, resulting in a low utilization rate of X-rays after penetrating the sample.
On the other hand, although the detector based on energy integration can obtain the structural information inside the sample, its ability to obtain the information of the sample material composition is insufficient.

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  • X-ray phase contrast imaging system based on photon counting, X-ray phase contrast imaging method realized by the system, and key equipment of X-ray phase contrast imaging method

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Embodiment Construction

[0041] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0042] It is known from common sense in physics that the wavelength of X-rays is much shorter than that of visible light. The imaging of this special light source can obtain thousands of times the spatial resolution of an optical microscope. We can use this feature to solve the problem that traditional optical microscopes cannot distinguish nanoscale spatial structures. On the other hand, using nuclear electronics technology and semiconductor technology, we can artificially control the radiation spectrum of the X-ray source, and identify the energy carried by each single X-photon after penetrating the sample. This type of energy information can provide more sample information.

[0043]Under the guidance of the above technical ideas, the present invention uses photon counting technology, phase contrast imaging technology and three-di...

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Abstract

The invention discloses an X-ray phase contrast imaging system based on photon counting and also discloses an X-ray phase contrast imaging method realized by the system and key equipment of the X-ray phase contrast imaging method. In the system, an X-ray source is used for emitting X rays to a sample on a scanning platform; when the X rays penetrate through the sample, photons carrying material characteristic information in a space position are generated and the photons of an imaging plane are counted by a photon counting detector to obtain projection data and energy data of the emitted photons; then data are transmitted to a three-dimensional reconstruction system; and the three-dimensional reconstruction system is used for reconstructing a three-dimensional structure and substance component types in the sample according to the projection data and the energy data, and carrying out digital dyeing on components of the sample, so that the substance components of the sample are identified. According to the X-ray phase contrast imaging system, weak absorption substances are subjected to nondestructive testing by adopting a photon counting technology, a phase contrast imaging technology and a three-dimensional reconstruction technology, and digital wax blocks with the energy resolution capability and the micro-grade or nano-grade space resolution capability can be obtained.

Description

technical field [0001] The invention relates to an X-ray imaging system, in particular to an X-ray phase-contrast imaging system based on photon counting, and also relates to a method and key equipment for realizing X-ray phase-contrast imaging of the system, belonging to the technical field of radiation imaging. Background technique [0002] The X-ray imaging system detects the internal structure of an object based on the principle that substances absorb X-rays differently, that is, absorption contrast imaging. In practice, traditional X-ray imaging systems can clearly image substances composed of elements with large atomic numbers (such as human bones, etc.), while weakly absorbing substances composed of elements with small atomic numbers (such as carbon, hydrogen, and oxygen) (such as tissue blocks removed during surgery, cell masses taken out by needle biopsy, sediment after centrifugation of body fluids, etc.), etc., are blurred or even impossible to image. When detect...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/04G01N23/083
Inventor 曹红光李运祥郑海亮
Owner NANOVISION TECHNOLOGY (BEIJING) CO LTD
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