X-ray phase contrast imaging system based on photon counting, X-ray phase contrast imaging method realized by the system, and key equipment of X-ray phase contrast imaging method
A photon counting and phase-contrast imaging technology, applied in the field of radiation imaging, can solve the problems of limiting the practical application of grating phase-contrast imaging technology, insufficient ability to obtain sample material composition information, and low utilization rate of X-rays
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[0041] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0042] It is known from common sense in physics that the wavelength of X-rays is much shorter than that of visible light. The imaging of this special light source can obtain thousands of times the spatial resolution of an optical microscope. We can use this feature to solve the problem that traditional optical microscopes cannot distinguish nanoscale spatial structures. On the other hand, using nuclear electronics technology and semiconductor technology, we can artificially control the radiation spectrum of the X-ray source, and identify the energy carried by each single X-photon after penetrating the sample. This type of energy information can provide more sample information.
[0043]Under the guidance of the above technical ideas, the present invention uses photon counting technology, phase contrast imaging technology and three-di...
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