Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Interest point detection method and system of three-dimensional (3D) point cloud

A technology of point of interest detection and point of interest, which is applied in the field of computer vision, can solve problems such as operating efficiency limitations, noise sensitivity, noise, occlusion, and unrobust aggregation, and achieve good stability, reduce calculations, and improve algorithm efficiency. Effect

Active Publication Date: 2015-05-13
BEIJING SAMSUNG TELECOM R&D CENT +1
View PDF4 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The interest points detected by NARF are located in the area with sudden changes near the local surface stability. Due to the influence of the boundary, the interest point is more likely to be located near the boundary
In addition, because the algorithm involves the solution of normal and curvature, it is sensitive to noise, so the operating efficiency of the algorithm is also limited.
In summary, the problem with the existing technology is that it is either not robust to noise, occlusion, aggregation, etc., or the algorithm operation efficiency is low

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Interest point detection method and system of three-dimensional (3D) point cloud
  • Interest point detection method and system of three-dimensional (3D) point cloud
  • Interest point detection method and system of three-dimensional (3D) point cloud

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0039] Embodiments of the present invention will now be described in detail, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to like parts throughout. The embodiments are described below in order to explain the present invention by referring to the figures.

[0040] figure 1 is a block diagram showing the structure of a 3D point cloud interest point detection system according to an embodiment of the present invention.

[0041] Such as figure 1 As shown, the 3D point cloud interest point detection system includes: a 3D point cloud data acquisition module 10 , a shape description module 20 and an interest point extraction module 30 .

[0042] Specifically, the 3D point cloud data acquisition module 10 is used to acquire 3D point cloud data. For example, the 3D point cloud data acquisition module 10 can acquire various forms of 3D point cloud data, such as unordered point clouds obtained by a 3D scanner, depth images obtain...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an interest point detection method and system of three-dimensional (3D) point cloud. The system comprises a 3D point cloud data acquisition module, a shape description module and an interest point extraction module, wherein the 3D point cloud data acquisition module is used for obtaining 3D point cloud data; the shape description module is used for generating a shape description vector of a surface wherein a pixel and a neighbourhood point are positioned by the distribution information of directed distance between the neighbourhood point of the pixel and a tangent plane where the pixel is positioned in the input 3D point cloud; and the interest point extraction module extracts the interest point on the basis of the generated shape description vector.

Description

technical field [0001] The present invention relates to the fields of computer vision and intelligent robotics, and more specifically, the present invention relates to a method and system for detecting interest points in a three-dimensional (3D) point cloud. Background technique [0002] In recent years, with the popularization of depth cameras or 3D scanners, the acquisition and processing technology of 3D point cloud data has attracted extensive attention. In the fields of computer vision and intelligent robotics, the 3D point cloud interest point detection algorithm is the starting point algorithm for many advanced application technologies, such as surface registration or object recognition technology. [0003] The interest point detection algorithm has three important characteristics: (1) Sparseness (Sparseness), that is, the number of interest points should be as small as possible to facilitate the efficient and feasible subsequent description of the matching algorithm;...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06T7/00
CPCG06T2200/04G06T2207/10028G06T7/33
Inventor 王山东宫鲁津张辉李宣旼李炯旭
Owner BEIJING SAMSUNG TELECOM R&D CENT
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com