Unlock instant, AI-driven research and patent intelligence for your innovation.

A kind of epitaxial structure of light-emitting diode and its manufacturing method

A technology of light-emitting diodes and epitaxial structures, which is applied to electrical components, circuits, semiconductor devices, etc., and can solve the problems of low LED lumen efficiency

Active Publication Date: 2017-03-29
QUANZHOU SANAN SEMICON TECH CO LTD
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Various avenues have been tried to improve IQE, but there is still a long way to go to achieve this goal
[0003] In view of the problem that the lumen efficiency of LED is still low in the prior art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A kind of epitaxial structure of light-emitting diode and its manufacturing method
  • A kind of epitaxial structure of light-emitting diode and its manufacturing method
  • A kind of epitaxial structure of light-emitting diode and its manufacturing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0037] The schematic diagram of the epitaxial structure of the light-emitting diode proposed in this embodiment is shown in the attachment figure 1 . by figure 1 It can be seen that the epitaxial structure of the light emitting diode includes: the bottom layer is the substrate 101, and the substrate material is sapphire; the AlN buffer layer 102 on the substrate 101; the first conductivity type semiconductor layer is sequentially arranged on the AlN buffer layer 102 , Light-emitting layer multiple quantum well structure and second conductivity type semiconductor layer, where the first conductivity type semiconductor layer is an N type semiconductor layer, the second conductivity type semiconductor layer is a P type semiconductor layer, and the material of the N type semiconductor layer can be N type AlN, GaN, Al x Ga 1-x N, Al x In 1-x N, In y Ga 1-y N or (Al x Ga 1-x ) 1-y In y Single-layer or multi-layer structure such as N, where 0 x Ga 1-x N, Al x In 1-x N, In y Ga 1-y N or ...

Embodiment 2

[0057] Such as Figure 4 As shown, the difference from embodiment 1 is that embodiment 1 first fills the surface of the nano-scale pits with a nano-scale layered Al metal reflective layer 104b, and then epitaxially grows quantum on the surface of the nano-scale metal reflective layer 104b. The dot 104c serves as a quantum well layer; and in this embodiment, the quantum dot 104c is filled in the nano-scale pit as a quantum well layer, and then a nano-scale Al metal reflective layer 104b is formed on the surface of the quantum dot 104c. The reflective layer 104b can increase the reflectivity of the light emitted by the multi-quantum well structure of the light-emitting layer and increase the light extraction efficiency. The epitaxial structure of the light-emitting diode prepared in this way is suitable for front-mounted light-emitting diodes, and also suitable for vertical light-emitting diodes and flip-chip light-emitting diodes. diode.

Embodiment 3

[0059] Such as Figure 5 As shown, the difference from Embodiment 2 is that the nano-scale Al metal reflective layer 104b in Embodiment 2 is layered, while the nano-scale Al metal reflective layer 104b formed in this embodiment is scattered dots. Further, the scattered metal reflective layer is formed by the following process conditions:

[0060] After the layered Al metal reflective layer is formed, the temperature is increased to 1000~1100℃, preferably 1100℃, and H 2 , Thereby corroding the layered Al metal reflective layer into scattered dots (nano-particles), playing the role of mirrors and forming surface plasmon.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an epitaxial structure of a light-emitting diode and a manufacturing method thereof. Quantum dots are used as the quantum well layer of a multi-quantum well structure (MQW) in the light-emitting layer, and the quantum confinement effect of the quantum dots can be used to effectively improve the density of electrons and holes. Recombination efficiency; at the same time, setting a nanoscale metal reflective layer on the quantum barrier layer with nanoscale pits can make the light emitted by the MQW immediately reflected to the front of the epitaxial structure; in addition, the nanoscale metal reflective layer can form surface plasmons ( suface plasmon) to further improve the light extraction efficiency.

Description

Technical field [0001] The invention relates to the field of semiconductor optoelectronic devices, in particular to an epitaxial structure of a light emitting diode and a manufacturing method thereof. Background technique [0002] Nowadays, light-emitting diodes (LEDs) provide their applications in general lighting. However, due to the low internal quantum efficiency (IQE), the lumen efficiency of the LED is low, and it has not yet been able to obtain an appropriate market share in lighting. In order to promote the marketization of white light LEDs, it is an urgent task to greatly increase the lumen efficiency of LEDs. Various approaches have been tried to improve IQE, but there is still a long way to achieve this goal. [0003] In view of the problem of low lumen efficiency of LEDs in the prior art. Therefore, it is necessary to propose a new epitaxial structure of a light emitting diode and a manufacturing method thereof. Summary of the invention [0004] The purpose of the pr...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L33/06H01L33/10H01L33/00
CPCH01L33/007H01L33/06H01L33/10H01L33/0075H01L33/12H01L2933/0025
Inventor 郑锦坚寻飞林伍明跃郑建森李志明杜伟华邓和清周启伦李水清康俊勇
Owner QUANZHOU SANAN SEMICON TECH CO LTD