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Electromagnetic compatibility current probe transmission resistance temperature error correction method

A technology of current probe and transmission impedance, applied in the field of current probe transmission impedance temperature error correction, to achieve the effect of reducing measurement uncertainty, improving accuracy and reducing error

Active Publication Date: 2015-07-01
BEIHANG UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

But it only gives the transmission impedance of the current probe under one temperature condition, that is, the transmission impedance of the current probe under the standard temperature condition (20°C) of the EMC microwave anechoic chamber

Method used

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  • Electromagnetic compatibility current probe transmission resistance temperature error correction method
  • Electromagnetic compatibility current probe transmission resistance temperature error correction method
  • Electromagnetic compatibility current probe transmission resistance temperature error correction method

Examples

Experimental program
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Embodiment

[0040] The present invention is further described with an example below, and the 9123-1N type current probe of Solar Company is selected for testing.

[0041] In the standard electromagnetic compatibility laboratory, the current probe, calibration fixture, 50Ω load, temperature test box, signal source, and spectrum analyzer are figure 2 Arrange as shown. During the test, only the temperature in the box is changed, and other test configurations remain unchanged. Test the transmission impedance of the current probe according to the following steps.

[0042] Step 1: If figure 2 As shown, the current probe is clamped on the calibration fixture and placed in the temperature test box, and the current probe is connected to the spectrum analyzer. One end of the calibration fixture is connected to a 50Ω load, and the other end is connected to the signal source.

[0043] Determine the test configuration.

[0044] Test frequency band: 0.01MHz~400MHz;

[0045] Signal source output...

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Abstract

The invention discloses an electromagnetic compatibility current probe transmission resistance temperature error correction method. The method includes firstly arranging a current probe with a calibration fixture into a temperature test box made of non-metal wave penetrating material; maintaining the test arrangement, changing the temperature of the temperature test box only, calibrating the transmission resistance of the current probe, and acquiring the transmission resistance value of the current probe on different temperature conditions; finally, calculating the corresponded errors of transmission resistance of the current probe on different temperature conditions and standard temperature condition; in the post field test, according to the external test environment temperature value, correcting the transmission resistance of the current probe through the corresponded errors.

Description

technical field [0001] The invention relates to the technical field of electromagnetic compatibility testing, in particular to a method for correcting the transmission impedance temperature error of a current probe. Background technique [0002] The electromagnetic compatibility test is completed under a standard test site using standard test equipment and in accordance with standard test methods. With the advancement of science and technology and the improvement of economic conditions, at present, there are EMC microwave anechoic chambers with temperature and humidity control available in China. However, large-scale or multi-entity system tests, on-site rapid interference diagnosis and troubleshooting, etc., are often required to be carried out outdoors (such as an open test site) due to the limitation of the shape and size of the tested product and other test conditions, and the electromagnetic compatibility test equipment will be affected. The influence of the external n...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R35/00
Inventor 何洋刘洪颐赵子华苏东林
Owner BEIHANG UNIV
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