Device and method for extracting physical parameters of special environment on basis of resonance frequency tests

A technology of resonant frequency and physical parameters, used in measurement devices, transmission of sensing components using wave/particle radiation devices, radio wave measurement systems, etc. Accuracy and other issues, to achieve the effect of reducing the difficulty of development, low development difficulty, and strong environmental adaptability

Active Publication Date: 2015-07-01
CHINA ELECTRONIS TECH INSTR CO LTD
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0006] Existing physical parameter extraction methods cannot be applied to physical parameter testing under certain special environments (such as high temperature, high pressure, etc.), for example, there is no effective pressure in-situ test method for over 300°C, and there is no long-term in-situ temperature parameter over 1000°C Testing methods currently mainly rely on indirect testing methods such as extrapolation and pressure induction, which have problems such as inaccurate results and insufficient dynamic response, and cannot realize real-time detection and control of physical parameters in special environments
Physical parameter testing technology in special environments has become a "bottleneck" restricting equipment performance improvement

Method used

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  • Device and method for extracting physical parameters of special environment on basis of resonance frequency tests
  • Device and method for extracting physical parameters of special environment on basis of resonance frequency tests
  • Device and method for extracting physical parameters of special environment on basis of resonance frequency tests

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Embodiment Construction

[0048] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0049] A special environmental physical parameter extraction method based on resonant frequency testing, such as figure 2 Shown is a scheme block diagram of the physical parameter extraction method, which mainly consists of two parts: a transmitting unit (2-1) in a special environment and a receiving unit (2-2) in a general environment. First, the signal emitted by the radio frequency source (2-8) of the receiving unit is divided into two paths through the bridge (2-7), wherein the signal of one path and the local oscillator source (2-10) pass through the reference mixer (2-9 ) for mixing, and the mixed reference intermediate frequency signal (IFR) is used as a reference signal; the other signal is transmitted to the receiving antenna (2-5), and the receiving antenna (2-5) is used to extract the signal via the transmitting antenna (2-4) and The microw...

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Abstract

The invention discloses a device and a method for extracting physical parameters of a special environment on the basis of resonance frequency tests. The device comprises a transmitting unit and a receiving unit. The transmitting unit is located in the special environment, and the receiving unit is located in a conventional environment; the transmitting unit is communicated with the receiving unit via a transmitting antenna and a receiving antenna; a passive microwave resonance structure is arranged inside the transmitting unit in the special environment; the receiving unit at the normal temperature under the normal pressure is far away from the special environment. The device and the method have the advantages that the passive microwave resonance structure which is sensitive to the physical parameters is arranged in the measured environment, resonance frequencies of the resonance structure can correspondingly drift under the condition of indexes of the different physical parameters, frequency drift of the microwave resonance structure can be detected, and accordingly the physical parameters can be tested in the special environment by the aid of relations between the resonance frequencies and the physical parameters.

Description

technical field [0001] The invention relates to a special environmental physical parameter extraction device and method based on resonance frequency testing. Background technique [0002] With the rapid development of the domestic equipment manufacturing industry, the processing, preparation and testing of many special equipment or special materials need to be completed in special environments (such as high temperature, high pressure, etc.), and some key components have been in special environments for a long time, requiring real-time and accurate The physical parameter data of the special environment in which it is monitored. The acquisition of physical parameters in these special environments plays a vital role in the improvement of the equipment manufacturing process level and product technical indicators. However, due to the limitations of special environments, the acquisition methods of these physical parameters cannot be directly completed. can be obtained indirectly ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01S13/02
CPCG01D5/48
Inventor 张文强宁曰民年夫顺刘金现姜万顺
Owner CHINA ELECTRONIS TECH INSTR CO LTD
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