Method for testing photovoltaic module through infrared imagery analysis

A photovoltaic module and infrared imaging technology, which is applied in the direction of material analysis, material analysis, and measuring devices through optical means, can solve problems such as poor raw materials of cells, heating of components, and shortened service life of photovoltaic components.

Inactive Publication Date: 2015-07-29
苏州普德认证有限公司
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  • Abstract
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  • Claims
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Problems solved by technology

[0003] During the manufacturing process of photovoltaic modules, the components may be locally heated during operation due to problems such as poor raw materials of the cells, poor welding of the cells or junction boxes, etc.
Poor raw materials of the battery sheet may cause serious hot spot effect. If the temperature generated by the hot spot effect exceeds a certain limit, the solder joints on the battery module will be m

Method used

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Embodiment Construction

[0017] Preferred embodiments of the present invention will be described in detail below.

[0018] In order to achieve the purpose of the present invention, in one of the embodiments of the present invention, a test method for infrared imaging analysis of photovoltaic modules is provided, including the following steps:

[0019] Step 1: Select the photovoltaic module to first check the appearance of the photovoltaic module, and then test the power output of the photovoltaic module under standard test conditions, and measure the open circuit voltage U of the photovoltaic module under standard test conditions oc , short-circuit current I sc ;

[0020] Step 2, use the power supply device to pass the following current and voltage conditions to the photovoltaic module: U>(1+3%)U oc , Isc , when the module reaches thermal equilibrium, use an infrared thermal imager to take an infrared image of the photovoltaic module, wherein the condition of thermal balance is that the temperature ...

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Abstract

The invention discloses a method for testing a photovoltaic module through infrared imagery analysis. The method comprises the following steps: step 1, detecting the appearance of the photovoltaic module, and then testing the power output of the photovoltaic module under the standard testing condition, and testing the open-circuit voltage Uoc and short-circuit current Isc of the photovoltaic module under the standard testing condition; step 2, charging the photovoltaic module with current and voltage by a supply unit, wherein U larger than (1+3%)Uoc, and I is smaller than Isc, and after the component is thermally balanced, shooting the infrared image of the photovoltaic module by a thermal infrared imager; step 3, selecting the temperature testing range according to the infrared image, and calculating the temperature difference between the highest temperature and the average temperature of the photovoltaic module. After the photovoltaic module is powered on to achieve the thermal balance, the infrared image is shot by the thermal infrared imager, and the temperature difference between the highest temperature and the average temperature of the photovoltaic module is calculated, so as to evaluate the capability of withstanding high temperature of the photovoltaic module, and have guiding significance in reduction and prevention of a hot-spot phenomenon.

Description

technical field [0001] The invention belongs to the technical field of photovoltaic module testing, and in particular relates to a testing method for infrared imaging analysis of photovoltaic modules. Background technique [0002] When the photovoltaic modules are working outdoors, the photovoltaic modules are in the state of output power in series, the modules themselves are in a high temperature state, and the ambient temperature and humidity also fluctuate with the seasons. There is no testing method for photovoltaic modules in the prior art. [0003] During the manufacturing process of photovoltaic modules, the components may be locally heated during operation due to problems such as poor raw materials of the cells, poor welding of the cells or junction boxes, etc. Poor raw materials of the battery sheet may cause serious hot spot effect. If the temperature generated by the hot spot effect exceeds a certain limit, the solder joints on the battery module will be melted a...

Claims

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Application Information

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IPC IPC(8): G01N21/359
Inventor 张飞飞陈沁梅晓俊
Owner 苏州普德认证有限公司
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