Solder joint defect detection method of ic components based on mixed Gaussian model
A technology of mixed Gaussian model and Gaussian model, applied in image data processing, instrumentation, calculation, etc., can solve the problems of fast detection speed, low accuracy rate, small solder joint size, etc., and achieve fast detection speed, high accuracy rate, calculation The effect of volume reduction
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0058] refer to figure 1 , the present invention provides a kind of IC element solder joint defect detection method based on mixed Gaussian model, comprising:
[0059] S1. Initialize the template number, weight, mean and variance of the mixed Gaussian model, and build a frequency distribution map according to the height and width of the training picture;
[0060] S2. Obtain the IC solder joint training picture from the training sample, and update the mixed Gaussian model and the frequency distribution diagram;
[0061] S3. Determine whether the training sample has been trained, if so, calculate the defect degree threshold of the training sample, otherwise return to step S2;
[0062] S4. After collecting the picture of the solder joint of the IC component to be tested, the degree of defect of the picture is calculated in combination with the trained mixed Gaussian model and the frequency distribution map;
[0063] S5. Comparing the defect degree of the picture with the defect...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More 


