Integral sampling probe system for high temperature in situ processing
A sampling probe and in-situ processing technology, which is applied to sampling devices, preparation of test samples, instruments, etc., can solve the problems of high cost and low accuracy, and achieve the goals of improving accuracy, reducing maintenance, and reducing investment costs Effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0027] The specific implementation manner and working principle of the present invention will be further described in detail below in conjunction with the accompanying drawings.
[0028] Such as figure 1 As shown, a high-temperature in-situ processing integrated sampling probe system includes a sampling probe 1. The sampling probe 1 is provided with a sampling tube 12 and a filter chamber 15. A sample gas outlet 19 is provided on the filter chamber 15. In the sampling probe 1 The sample gas outlet 19 is connected with a laser measuring gas chamber 2, the gas outlet of the laser measuring gas chamber 2 is connected with a pneumatic sampling pump 6, and the left and right sides of the laser measuring gas chamber 2 are respectively provided with a laser transmitter 3 and a laser receiver. The device 4, the filter chamber 15 of the sampling probe 1, the laser measuring gas chamber 2, the laser transmitter 3, the laser receiver 4 and the pneumatic sampling pump 6 are all arranged i...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More 


