A Vertical Ionogram Inversion Method

Abstract

The invention discloses a vertical ionogram inversion method, comprising the following steps: step 1: establishing a mathematical model of the ionosphere profile, the model is a three-layer model including an E layer, a valley layer and an F layer; step 2: Calculation of the false height of the reflection echo of each layer, based on the established ionospheric model, deduce the calculation formula of the false height of the E layer and F layer; Step 3: Using the measured ionogram data, combined with the E layer, F layer echo false height The calculation results are used to invert the ionospheric parameters of the E layer, the valley layer and the F layer. The vertical measurement ionogram inversion method disclosed by the invention overcomes the shortcomings of the prior art, and proposes a vertical measurement ionogram inversion method based on the constraints of the shifted Chebyshev polynomial model to optimize the parameters of the F layer. After the layer parameters are determined, the echo trace data in the higher area of ​​the F layer is selected, and under the constraint of ensuring the continuous and smooth profile, the polynomial coefficient of the F layer profile is calculated, and the ionospheric profile is finally determined, which can effectively improve the inversion accuracy and stability.

Description

technical field [0001] The invention relates to the field of ionospheric research and application, in particular to a method for inverting ionospheric parameters by using a vertical ionogram. Background technique [0002] Using the vertical ionogram to invert the ionospheric profile (the correspondence between the height of the ionosphere and the plasma frequency or electron concentration) has been widely valued by people. At present, the vertical ionogram inversion methods can be summarized into the following two types: ① direct Calculation method, which directly uses the measured false height to calculate the real reflection height of the corresponding frequency (abbreviated as true height), mainly including slice method, single polynomial method, overlapping polynomial method, etc. Some of these methods are based on the establishment of true height and false height. Simultaneous equations, directly solve the true height based on the actual measured virtual height, such as...

AI Technical Summary

Problems solved by technology

The disadvantage of this method is that the valley parameters and the polynomial coefficients of the F layer profile are determined by directly using the data selected for inversion of the valley parameters, so that the vertical ionogram synthesized based on the inversion results and the measured ionogram The echo tracing deviation is larger in the higher area of ​​the F layer

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