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General test device

A general-purpose test and test slot technology, applied in the direction of the measuring device casing, etc., can solve the problems that the size and weight of the pressure block 75 cannot be integrated, excessive pressure, inconvenience, etc.

Active Publication Date: 2015-11-04
UNIVERSAL SCIENTIFIC INDUSTRIAL (SHANGHAI) CO LTD +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In this way, in order to allow the pressure block 75 to smoothly push the object under test 73 downwards so that the object under test 73 can be electrically connected to the probe 74, the size of the pressure block 75 must not only be smaller than the test groove 72, At the same time, in order to prevent the problem of excessive pressure on the object under test 73, the size and weight of the pressure block 75 need to be specially designed and cannot be used in one piece, which is very inconvenient

Method used

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Embodiment Construction

[0032] In order to better understand the characteristics of the present invention, the present invention provides a preferred embodiment, which is described as follows in conjunction with the accompanying drawings, please refer to Figure 3 to Figure 5 .

[0033] Universal testing device 1 of the present invention is used for testing object under test, and object under test is SiP module (System in Package, system-in-package module) in the present embodiment, and it also can be SoC module (System on Chip, system chip) ) or other forms of analytes, but not limited to this embodiment. The main components of the universal testing device 1 of the present invention include a carrier plate 10, a pressure head 20 and a plurality of elastic positioning members 30 (six in this embodiment), the structure of each component and the relationship between them are described in detail as follows.

[0034] Please refer to Figure 4 1, the central recess of the carrier plate 10 is provided w...

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Abstract

A general test device is used for testing an object to be tested. The general test device comprises a bearing disc, a pressurized head and a plurality of elastic positioning components. The bearing disc is provided with a test groove. A probe is arranged in the test groove. The pressurized head is movably arranged on the bearing disc and possesses a briquetting. The briquetting can be close to the test groove along with movement of the pressurized head and exert pressure on the object to be tested. The elastic positioning components are arranged on the bearing disc, surround and are close to an outer periphery of the test groove. Therefore, because of the elastic positioning components, the object to be tested with a thin thickness is not easy to be influenced by an outer force so as to be out of the test groove. And during a test process, the elastic positioning components do not influence the briquetting to push against the object to be tested. The briquetting does not need to be designed individually and can be used generally so that usage is convenient.

Description

technical field [0001] The present invention relates to a test device, in particular to a structural improvement of the test device, wherein a plurality of elastic positioning pieces are added near a test slot used for testing and fixing a test object to help locate the position of the test object. Background technique [0002] For traditional test sets, please refer to figure 1 , wherein, the center of the carrier plate 71 is provided with a test groove 72 to accommodate the object to be tested 73, the bottom of the test groove 72 is provided with several probes 74, and the depth of the test groove 72 is roughly the same as the thickness of the object to be tested 73 quite. Therefore, when testing, the pressure block 75 exerts force downward to push the object under test 73, so that the pins (not shown) of the object under test 73 are electrically connected with the probes 74 of the test slot 72, so that the object under test 73 performs various tests and tests whether th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/04
Inventor 高合助李冠兴
Owner UNIVERSAL SCIENTIFIC INDUSTRIAL (SHANGHAI) CO LTD
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