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Fault detection method and system

A fault detection and fault technology, which is applied in the field of fault detection methods and systems, can solve problems such as the lack of potential faulty disk processing methods, the failure of business to run normally, and the inability to accurately reflect the real state of disks, etc.

Active Publication Date: 2015-11-11
INSPUR BEIJING ELECTRONICS INFORMATION IND
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Problems solved by technology

[0003] The management of disk resources is a relatively important task in the cluster system. The carrier of business data in our system and software is the disk. Failure of disk resources will directly cause our business to fail to run normally.
Using the traditional RW method to detect the disk state cannot accurately reflect the real state of the disk, and there is also a lack of processing methods for potential faulty disks

Method used

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Embodiment Construction

[0033] In order to facilitate the understanding of those skilled in the art, the following further description of the present invention with reference to the accompanying drawings cannot be used to limit the protection scope of the present invention.

[0034] In the high-availability cluster technology, the traditional RW method of detecting the disk status only detects whether the disk status is normal based on the size of the input / output I / O return, and ignores the I / O return time and whether the disk is correct before the detection Mounting, therefore, cannot accurately detect the true state of disk resources, and cannot detect potentially faulty disks with large I / O delays.

[0035] This patent invents an improved method for detecting the state of disk resources in high-availability technology, which judges whether the disk is in a fault state by performing I / O operations on the blocks on the disk and querying the virtual file system proc system; By comparing the return time o...

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Abstract

The invention discloses a disk resource fault detection method and system. The method comprises: before performing input / output (I / O) operation on a physical block on disk resources, inspecting a virtual file system, namely a proc system, and determining whether the disk resources are correctly mounted in a local machine; when determining whether the disk resources are correctly mounted in the local machine, performing the I / O operation; comparing return time of the I / O operation with a preset time threshold value; when the return time is smaller than the time threshold value, judging that the disk resources are normal and performing fault detection on next I / O operation; and when the return time is greater than or equal to the time threshold value, judging that the disk resources are faulted and modifying self-inspection parameters of a disk file system. Through the scheme, the real state of a disk can be accurately reflected and the disk with potential faults is processed.

Description

Technical field [0001] The present invention relates to disk resource detection technology, in particular to a fault detection method and system. Background technique [0002] High-availability technology is a technology that can ensure the uninterrupted operation of our systems and software and provide normal services, and can quickly restore normal business in the event of a node failure or even downtime. The cluster system constructed by high-availability technology can manage and monitor various resources, including: database resources, IP resources, NIC resources, service resources, and disk resources. [0003] The management of disk resources is a relatively important matter for the cluster system. The carrier of the business data of our system and software is the disk. Failure of disk resources will directly cause our business to fail to operate normally. Using the traditional RW method to detect the status of the disk cannot accurately reflect the true status of the disk, ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22G06F3/06
Inventor 成金祥李大生刘志勇
Owner INSPUR BEIJING ELECTRONICS INFORMATION IND
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