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Analytical device and calibration method

An analysis device, a technology for composition analysis, applied in measurement devices, analysis of materials, material analysis using wave/particle radiation, etc., can solve problems such as inability to perform time-consuming

Active Publication Date: 2019-08-27
HORIBA LTD
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  • Application Information

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Problems solved by technology

[0008] On the other hand, when the component analysis of captured particulate matter such as PM2.5 is continuously performed in the air atmosphere, it is impossible to perform time-consuming calibration using standard samples, etc.

Method used

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  • Analytical device and calibration method
  • Analytical device and calibration method

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no. 2 Embodiment approach

[0090] In the first embodiment described above, the correction (calibration curve) was performed in consideration of the influence of the change over time. However, the present invention is not limited to this, and in order to perform elemental analysis using fluorescent X-rays from particulate matter P such as PM 2.5 with high accuracy, correction may be performed in consideration of other influences.

[0091] The particle state of the particulate matter contained in the atmosphere changes depending on the humidity of the atmosphere or the like. For example, as disclosed in Non-Patent Document 1, a graph showing the relationship between humidity and moisture absorption coefficient ( Figure 7 ) shows that in an atmospheric atmosphere with high humidity, the particle diameter increases after the particulate matter absorbs moisture based on the composition of the particulate matter. In addition, the moisture absorption coefficient when the humidity increases and the moisture a...

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Abstract

In an analyzing apparatus for analyzing compositions using a fluorescent X-ray in the atmosphere, a calibration to eliminate influences caused by a time-dependent change is performed. The analyzing apparatus includes an emission unit, a detection unit, an environment measurement unit, and a time-dependent change calculation unit. The emission unit emits a primary X-ray. The detection unit detects an intensity of a secondary X-ray passing through the atmosphere. The environment measurement unit measures an environment parameter defining the atmosphere. The time-dependent change calculation unit calculates a time-dependent change of the intensity of the secondary X-ray between a first timing and a second timing, based on a first environment parameter, a first intensity of the secondary X-ray, a second environment parameter, and a second intensity of the secondary X-ray.

Description

technical field [0001] The invention relates to an analysis device for the analysis of particulate matter and a calibration method for performing device calibration of said analysis device. Background technique [0002] In recent years, the floating particulate matter PM2.5 in the atmosphere with a particle size below 2.5 μm has become an environmental problem that has attracted people's attention. Furthermore, for the purpose of grasping the situation of PM2.5, a device for analyzing the concentration of PM2.5 in the atmosphere and the elements contained in PM2.5 has been developed. If the elements contained in PM2.5 are analyzed, it should be possible to deduce the source of the PM2.5. [0003] For example, Patent Document 1 discloses a measurement device for continuously and automatically analyzing the types of elements constituting floating particulate matter in the atmosphere by measuring fluorescent X-rays from floating particulate matter. [0004] prior art literatu...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/223
Inventor 水野裕介青山朋树
Owner HORIBA LTD