Multispectral crop growth sensor spectral reflectivity calibration method

A technology of spectral reflectance and crop growth, which is applied in the field of correction of spectral reflectance of multi-spectral crop growth sensors, can solve problems affecting the accuracy and practicability of sensors, achieve good application value, and improve the effect of monitoring accuracy

Active Publication Date: 2015-12-09
NANJING AGRICULTURAL UNIVERSITY
View PDF5 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The above-mentioned method of linearly correcting the reflectance collected by the sensor by only using the standard reflectivity ignores the influence of the sun altitude angle, so that the same field of view under the same light intensity, the reflectivity measured by the sensor due to the change of the sun altitude angle will change. Large changes have occurred, seriously affecting the accuracy and practicability of sensor monitoring

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Multispectral crop growth sensor spectral reflectivity calibration method
  • Multispectral crop growth sensor spectral reflectivity calibration method
  • Multispectral crop growth sensor spectral reflectivity calibration method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0030] The present invention will be further described in detail below in conjunction with specific embodiments.

[0031] 1) Between 10:00:00-14:00:00 in fine weather, monitor with grayscale panels with standard reflectivity of 5%, 10%, 20%, 40%, 60%, 75% and 99% Object, record the voltage corresponding to the incident light intensity of the uplink photosensor and downlink photosensor and And record the solar altitude angle θ at the time of collection i , i∈[1,n], n is the total number of collected data, for the data pair. The relationship between the voltage value of the upstream light sensor and the light intensity before correction figure 1 , figure 1 At the time of the same light intensity in the morning and afternoon, due to the difference in the sun's altitude angle, the upward photovoltage value does not change linearly with the light intensity, which is shown as a curve in the morning and afternoon in the figure.

[0032] 2) Refractive index n=1.53, calculate ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
refractive indexaaaaaaaaaa
Login to view more

Abstract

The invention discloses a multispectral crop growth sensor spectral reflectivity calibration method and belongs to the field of digital agriculture. In a multispectral crop growth sensor, incident light intensity of an uplink photo-sensor and a downlink photo-sensor is converted into voltage value. The method includes the steps of: converting the voltage value of the uplink photo-sensor into the voltage value corresponding to the light intensity of an incident interface of the sensor; obtaining reflectivity from the ratio of the light intensity voltage to the light intensity voltage of the incident interface; establishing a unary linear regression calibration equation from the reflectivity and standard reflectivity; and finally calculating the spectral reflectivity through the calibration equation. The method avoids influence on the spectral reflectivity due to solar altitude and has excellent universality.

Description

technical field [0001] The invention relates to a method for correcting the spectral reflectance of a multispectral crop growth sensor. It belongs to the field of digital agriculture. Background technique [0002] The spectral reflectance of the crop canopy can be used to obtain crop growth information such as leaf area index, leaf nitrogen content, and chlorophyll content, which has important guiding significance for precise management and regulation of crop production. To this end, people have developed low-cost crop growth monitoring instruments based on spectral reflectance, and use related models to calculate crop growth information according to reflectivity. It can be seen that reflectivity fundamentally determines the accuracy of instrument monitoring crop growth information. The spectral reflectance monitored by the sensor needs to be linearly corrected, and the linear correction equation is obtained by establishing a linear regression using the corresponding relati...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/55
Inventor 倪军曹卫星朱艳刘乃森庞方荣
Owner NANJING AGRICULTURAL UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap