Testing system of electronic element with pins

A technology for electronic components and test systems, which is applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of high production cost, low production efficiency of electronic components, and high labor intensity, saving labor and manual cleaning. process, the effect of improving accuracy

Active Publication Date: 2016-01-13
山东宝乘电子有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] With the development of society, more and more fields are becoming intelligent, and the most basic and important part is the electronic components. The current testing of the production of electronic components is done manually, requiring the operator to use the testing machine to test the electronic components one by one. The component is tested, and the test of the electronic component can only be completed after multiple tests, resulting in low production efficiency of the electronic component, high labor intensity and high production cost

Method used

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  • Testing system of electronic element with pins
  • Testing system of electronic element with pins
  • Testing system of electronic element with pins

Examples

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Embodiment 1

[0031] Such as figure 1 and figure 2 As shown, an electronic component testing system with a pin 93 includes a frame 1, a track 2, a transmission mechanism 3, a testing mechanism 41, a testing mechanism 42, a testing mechanism 43, a testing mechanism 44, a marking machine 5, a sixth Cylinder 6, feeding plate 7, material receiving box 8 and control system, track 2 is linear, fixedly connected on frame 1, transmission mechanism 3 is arranged on one side of track 2, along the transmission direction of electronic component 9 The arrangement is: 2 testing mechanisms 4, the sixth cylinder 6, a marking machine 5, 2 testing mechanisms 4 and the sixth cylinder 6 are arranged in sequence. The marking machine 5 is fixedly connected to the frame 1, the marking machine 5 is opposite to the notch 34, the marking machine 5 and the head of the electronic component 9 are located on the same plane, and the marking machine 5 marks the head of the electronic component 9 . The testing mechanis...

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PUM

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Abstract

The invention discloses a testing system of an electronic element with pins. The testing system comprises a rack, track, a transmission mechanism, and at least two testing mechanisms. The track is fixedly connected to the rack. The transmission mechanism is arranged at one side of the track and consists of a transmission plate, a first cylinder, and a second cylinder; the transmission plate is arranged above the track; and one side of the transmission plate is fixedly connected with the first cylinder and at least two notches are arranged at the other side of the transmission plate. Besides, the testing mechanisms contain testing machines, probe groups, and third cylinders; the probe groups are fixedly connected to fixed plates; and each probe group contains at least two probes. According to the testing system, testing and marking can be completed automatically; the time and effort are saved; and the production cost is lowered.

Description

technical field [0001] The invention relates to the technical field of electronic component testing machinery, in particular to an electronic component testing system with pins. Background technique [0002] With the development of society, more and more fields are becoming intelligent, and the most basic and important part is the electronic components. The current testing of the production of electronic components is done manually, requiring the operator to use the testing machine to test the electronic components one by one. The component is tested, and the test of the electronic component can only be completed after multiple tests, resulting in low production efficiency of the electronic component, high manual labor intensity, and high production cost. Contents of the invention [0003] Aiming at the above-mentioned problems in the prior art, the present invention provides a test system for electronic components with pins, which automatically completes the test, saves t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/01
Inventor 顾在意张善杰
Owner 山东宝乘电子有限公司
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