Macroscopic inspection machine capable of automatically positioning and measuring luminance

An automatic positioning and macro inspection technology, applied in the field of macro inspection machines, can solve problems such as potential safety hazards, inability to locate, and contamination of glass substrates, and achieve the effects of increased speed, fast illumination testing, and small errors

Inactive Publication Date: 2016-02-24
张笑多
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Because the macro inspection machine has no positioning device, it cannot be positioned. When there is a macro defect that needs to be measured, it is usually entered into the equipment to mark, or measure the distance from the edge of the glass to determine the distribution.
[0005] Entering the equipment to test the illuminance or measuring bad positions has great safety hazards, and will cause varying degrees of pollution to the glass substrate

Method used

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  • Macroscopic inspection machine capable of automatically positioning and measuring luminance

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Embodiment

[0027] Such as figure 1 As shown, a macro-inspection machine that can automatically position and measure illuminance includes a machine table for carrying glass and a support rod, and a vacuum suction cup arranged on the support rod for absorbing glass is arranged inside the machine table for The clamp for clamping the glass and the workbench for operating the machine are characterized in that the machine is a frame composed of a first horizontal plane, a second horizontal plane, a first vertical plane, and a second vertical plane. A horizontal scale is installed on the first horizontal surface, a vertical scale is installed on the first vertical surface, and the first vertical surface and the second vertical surface of the water are provided with the first horizontal scale for moving the horizontal scale along the vertical direction. A guide rail, the first horizontal plane and the second horizontal plane are provided with a second guide rail for the vertical scale to move in...

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Abstract

The invention discloses a macroscopic inspection machine capable of automatically positioning and measuring luminance. The macroscopic inspection machine comprises a machine table, support rods, vacuum chucks, clamps and a working table. The machine table and the support rods are used for supporting glass. The vacuum chucks are arranged on the support rods and used for absorbing glass. The clamps are arranged inside of the machine table and used for clamping glass. The working table is used for operating the machine table to operate. The machine table is a frame body made up of a first horizontal plane, a second horizontal plane, a first vertical plane and a second vertical plane. A horizontal ruler is arranged on the first horizontal plane. A vertical ruler is arranged on the first vertical plane. Luminance measuring devices are arranged below the support rods. The macroscopic inspection machine capable of automatically positioning and measuring luminance has following beneficial effects: the macroscopic inspection machine can perform luminance measure and macroscopic false orientation in a safe and rapid manner.

Description

technical field [0001] The invention relates to a macro inspection machine, in particular to a macro inspection machine capable of automatically positioning and measuring illuminance. Background technique [0002] In the production process of LCD panels, product inspection is an important link in the entire process of production. The inspection of LCD panels includes microscopic inspection, macroscopic inspection and data test, and these three inspections support each other. The macro inspection machine projects light to the glass substrate, and inspectors inspect the glass substrate from different angles through the light reflected by the glass substrate. [0003] The intensity of the light directly affects the judgment result of the inspector. After the acceptance of the equipment, the adjustment of the optical path, and the replacement of the light source, it is necessary to conduct an illumination test to judge whether it is qualified. At present, the illuminance test ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02F1/13G01J1/02
CPCG02F1/1309G01J1/0271
Inventor 张笑多
Owner 张笑多
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