mos device pk meter
A MOS device and device technology, which is applied in the field of MOS device testing, can solve the problem of taking a long time, and achieve the effect of intuitive comparison, light weight and simple operation
Active Publication Date: 2018-04-20
桂林斯壮桂微电子有限责任公司
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Problems solved by technology
[0003] What the present invention is to solve is that the comparison method of existing MOS device products needs to spend a long time and apply to the problem of more test / test equipment, and provides a MOS device PK instrument
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Embodiment Construction
[0014] A MOS device PK instrument, such as figure 1 As shown, it mainly consists of a housing 1, a power switch 3 fixed on the housing 1, 2 liquid crystal display screens 2, 2 groups of test gear selection keys 4 and 2 groups of adjustment knobs 5, and the 2 sets of test platforms 6; wherein the power switch 3 is connected to the power terminals of the 2 sets of test platforms 6 at the same time; the input terminals of each test platform 6 are respectively connected to a set of test gear selection keys 4 and a set of output terminals of the adjustment knob 5 ; The output end of each test platform 6 is connected to a liquid crystal display screen 2 .
[0015] Each set of test platform 6 is composed of a power supply module, a microcontroller, a voltage measurement module, a gate voltage generation module, a constant current source module, a current measurement module and a temperature measurement module; wherein the output of the power supply module is connected to the microcon...
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The invention discloses an MOS device PK instrument, which mainly comprises a shell, a power switch fixed on the shell, two liquid crystal display screens, two groups of test gear selection keys, two groups of adjustment knobs, and two sets of test platforms arranged inside the shell, wherein the power switch is connected with power ends of the two sets of test platforms at the same time; the input end of each set of test platform is connected with output ends of one group of test gear selection keys and one group of adjustment knobs; and the output end of each set of test platform is connected with one liquid crystal display screen. The MOS device PK instrument has the advantages that the operation is simple, the contrast condition is intuitive, an expensive detection / test device does not need to be bought, and the sample performance contrast condition can be easily known; the size is small, the weight is light, carrying is facilitated, a business person can demonstrate the product performance intuitively for a client, and a researcher can quickly know the sample performance contrast condition on the field.
Description
technical field [0001] The invention relates to the field of MOS device testing, in particular to a MOS device PK instrument. Background technique [0002] During the research and development of new MOS device products and the performance demonstration of new MOS products, we often have to compare the same type of MOS device products of different brands to judge the performance of each product. Usually, before comparing products, it is necessary to compare the electrical parameter data of each sample. It is often encountered that some samples have data information, but some samples do not have data information. If there is no data for the sample, it must be returned to the laboratory or factory for actual measurement to obtain the sample data. After data comparison, tests under specific application environment conditions can be carried out, and finally the comparison test results can be obtained. In this way, we cannot keep abreast of the comparison situation on site, and...
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IPC IPC(8): G01R31/00
CPCG01R31/007
Inventor 王常毅李勇昌邹锋彭顺刚朱金华
Owner 桂林斯壮桂微电子有限责任公司