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Chip front-end simulation detection method and device

A detection device and chip technology, applied in faulty hardware testing methods, error detection/correction, faulty computer hardware detection, etc., can solve the problems of increased code volume, unfavorable chip front-end simulation detection device reuse and maintenance, etc., to reduce The effect of code size, ease of reuse and maintenance

Active Publication Date: 2019-04-09
TANGRAM MICROELECTRONICS TECH SHANGHAI CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] This detection method will increase the amount of code required by the chip front-end simulation detection device, which is very unfavorable for the reuse and maintenance of the chip front-end simulation detection device

Method used

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  • Chip front-end simulation detection method and device
  • Chip front-end simulation detection method and device
  • Chip front-end simulation detection method and device

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Embodiment Construction

[0025] In order to make the objectives, technical solutions, and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. . Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.

[0026] The chip front-end simulation detection device provided by the embodiment of the present invention has the same structure as the existing chip front-end simulation detection device. There is no need to make any changes in the structure, and only the simulation unit 130 yuan, the monitoring unit 122 (ie the second monitoring unit) and the The function of the comparison unit 140 is sufficient.

[0027] In this embodiment, o...

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Abstract

Embodiments of the invention provide a chip front-end simulation detection apparatus and method. The chip front-end simulation detection apparatus comprises a first monitoring unit, a reference model unit, a second monitoring unit and a comparison unit, wherein the first monitoring unit is used for obtaining at least two types of input data of a chip and sending the at least two types of the input data to the reference model unit; the reference model unit is used for simulating the chip to process the at least two types of the input data to obtain at least two types of reference data, extracting a maximum common divisor set of the at least two types of the reference data to generate reference combination data, and sending the reference combination data to the comparison unit; the second monitoring unit is used for obtaining at least two types of output data output by the chip, extracting a maximum common divisor set of the at least two types of the output data to generate output combination data, and sending the output combination data to the comparison unit; and the comparison unit is used for determining that the chip front-end simulation detection is passed if the reference combination data and the output combination data are same.

Description

Technical field [0001] The invention relates to the field of chip front-end simulation detection. Background technique [0002] Such as figure 1 As shown, an existing chip front-end simulation detection device includes: a driving unit 110, two monitoring units 121 and 122, a reference model unit 130, and a comparison unit 140. The driving unit 110 is used to generate input data and send the input data to the chip to be tested. Of the two monitoring units, one monitoring unit 121 is used to obtain the input data of the chip to be tested and send the input data to the reference model unit; the other monitoring unit 122 is used to obtain the output data of the chip to be tested and send the output data To the comparison unit. The reference model unit 130 is used to simulate the behavior of the chip to be tested and process the input data to obtain the correct output data that the chip to be tested should output (for ease of description, the data generated by the reference model un...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22
CPCG06F11/2236G06F11/2273
Inventor 赵治心
Owner TANGRAM MICROELECTRONICS TECH SHANGHAI CO LTD
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