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Crystal bar cutting method and wire saw

A technology of ingots and steel wires, applied in the field of cutting methods and wire saws, can solve problems such as thinning, and achieve the effect of improving productivity and consistent processing conditions

Active Publication Date: 2017-08-22
SHIN-ETSU HANDOTAI CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0012] In addition, if the distribution of the thickness of the wafer cut out from the ingot is confirmed, the thickness of the wafer in the cutting start part of the ingot becomes thinner than that in the central part.

Method used

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  • Crystal bar cutting method and wire saw
  • Crystal bar cutting method and wire saw
  • Crystal bar cutting method and wire saw

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0057] Such as figure 1 As shown, in the wire saw of the present invention, after replacing the steel wire with a steel wire in a new state, the cutting method of the present invention repeatedly performs cutting of a plurality of ingots.

[0058] The thickness unevenness of each wafer cut from each ingot was measured, and the average value of the thickness unevenness of each wafer cut from each ingot was calculated. In addition, the term “uneven thickness” refers to the difference between the thickness of the cutting start portion and the thickness of the center portion in the wafer surface as described above.

[0059] In Example 1, when the first ingot was cut after replacing the steel wire, when cutting the central part of the ingot, the new steel wire per unit time when cutting the cutting start part of the ingot was supplied. The ratio of the amount is set to 10%. Then, when cutting the second and subsequent ingots, the ratio of the new wire supply amount per unit time at th...

Embodiment 2

[0062] Except that the above ratio was set to 33% when the first ingot was cut after replacing the steel wire, and the above ratio was set to 66% when the second and subsequent ingots were cut, the same as in Example 1 was used. Condition, repeated cutting of the ingot. That is, the above-mentioned ratio when the first ingot is cut is 1 / 2 of the above-mentioned ratio when the second and subsequent ingots are cut.

[0063] After the cutting of the ingot was completed, the thickness unevenness was measured by the same method as in Example 1, and the average value was calculated.

[0064] The result is image 3 As shown in Table 1, the average thickness of the wafer cut from the first ingot is 4.0 μm. In addition, the average thickness of the wafers cut from the second and subsequent ingots was 4.5 μm. Therefore, the difference in thickness unevenness was 0.5 μm, and as in Example 1, it was confirmed that the unevenness in thickness became very small.

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PUM

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Abstract

A method is disclosed for slicing an ingot by which wire rows are formed by using a wire that is spirally wound between a plurality of wire guides and travels in an axial direction. An ingot is pressed against the wire rows while supplying a working fluid to a contact portion of the ingot and the wire, thereby slicing the ingot into wafers, and a ratio of a wire new line feed amount per unit time in slicing of a slicing start portion of a first ingot to that in slicing of a centration portion of the same at the time of slicing the ingot after replacement of the wire is controlled to be ½ or less of the ratio at the time of slicing second and subsequent ingots after the replacement of the wire.

Description

Technical field [0001] The invention relates to a cutting method and a wire saw. The cutting method uses a wire saw to cut an ingot into a wafer shape. Background technique [0002] In recent years, wafers have been increasing in size. With this increase in size, wire saws dedicated to cutting ingots have been used. [0003] A wire saw is a device as described below, which makes a steel wire (high-tension steel wire) travel at a high speed, where the slurry is poured and the workpiece is crimped (for example, silicon ingots. Hereinafter, also referred to as Ingots) are cut to simultaneously cut out multiple wafers (see Patent Document 1). [0004] Here, Figure 4 The outline of an example of a conventional normal wire saw is shown. [0005] Such as Figure 4 As shown, the wire saw 101 is mainly composed of the following components: a steel wire 102, which is used to cut the ingot; a wire guide 103, which is wound with a steel wire 102; a tension imparting mechanism 104, which is used ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): B24B27/06B28D5/04H01L21/304
CPCB24B27/0633B28D5/0076B28D5/0082B28D5/045B23D57/0007H01L21/02002H01L21/78
Inventor 上林佳一
Owner SHIN-ETSU HANDOTAI CO LTD
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