Detection method of leaf area index

A technology of leaf area index and detection method, which is used in measuring devices, instruments, and optical devices to achieve the effect of increasing yield

Inactive Publication Date: 2016-04-20
ZHONGYUAN OPTOELECTRONICS MEASUREMENT & CONTROL TECH
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[0005] The purpose of the present invention is to provide a method for detecting leaf area index, which is

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  • Detection method of leaf area index
  • Detection method of leaf area index

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[0026] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0027] The leaf area index meter provided by the invention is a leaf area index meter based on the radiometric principle. The leaf area index meter generally includes a detector and a data processing device, wherein the detector is an optical system for collecting leaf information; the data processing device is used for data processing the information collected by the detector.

[0028] like figure 1 As shown, along the order from the object space to the image space, the detector includes a coaxially arranged fisheye lens, a filter and a convex lens. The fisheye lens is used to collect the incident light of the whole field of view. The incident light of the whole field of view includes several incident rays of different zenith angles. For the convenience of use, a level is installed on the shell of the fisheye lens. When the level shows the horizontal positi...

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Abstract

The invention relates to a detection method of a leaf area index. The method comprises: (1), n zenith angles are selected and light intensities of the n zenith angles are measured at the top and bottom of a plant; (2), according to a transmissivity, an average contact frequency is calculated; and (3), a leaf area index is calculated. With the method, the leaf area index and correlated parameters of the crop at the area can be obtained by analyses and statistics based on light energy changes. The method has characteristics of precise, rapid, and nondestructive measurement. Compared with the direct measurement method, the leaf area index can be obtained rapidly and automatically at the large area, so that the workload can be reduced substantially.

Description

technical field [0001] The invention relates to a method for detecting leaf area index. Background technique [0002] At present, the domestic measurement of leaf area index mainly adopts direct harvesting method and fallen leaf collection method. [0003] The direct harvesting method is the traditional method of determining the leaf area index, because this method is to cut down the plants directly, obtain all the leaves on the plant and calculate the area of ​​all the leaves, and then use the ratio of the total leaf area to the vertical shadow of the crown to obtain the leaf area index , the result is more accurate. Although this method can set up sample points in the vegetation area, and then obtain the leaf area index of the entire vegetation area through the measurement of the leaf area index in the sample point, it will destroy the vegetation in a large area, because the method is used in a large area. The accuracy of the measurement is related to the number of sampl...

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Application Information

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IPC IPC(8): G01B11/28
CPCG01B11/285
Inventor 余国河李秀红韩振宇李鹏牛素军李佳胡锦涛王中金张振强张勇陈浩苏振刘峰磊毛博识陈涛
Owner ZHONGYUAN OPTOELECTRONICS MEASUREMENT & CONTROL TECH
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