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Collimation line deformation measurement method

A measuring method and technology of sight line, applied in the field of sight line deformation measurement, can solve the problems of long distance between two ends, poor sighting accuracy, blurred target, etc., and achieve the effects of high measurement precision, reduced influence and convenient application.

Inactive Publication Date: 2016-05-11
POWERCHINA ZHONGNAN ENG
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0003] When the reference line is too long, the two ends are far away, the target is blurred, the aiming accuracy is too poor, and the distance between the backsight point and the measuring point is too far, the influence of the telescope focusing error is greater, and the influence of atmospheric refraction on the horizontal line of sight is the square of the distance relationship, undoubtedly has a significant impact on the observations

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  • Collimation line deformation measurement method
  • Collimation line deformation measurement method
  • Collimation line deformation measurement method

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Embodiment Construction

[0012] Such as figure 1 As shown, a long-distance multi-point line of sight, points A and B are the two reference points (end points) of the line of sight, and the line of sight has n measuring points, and the numbers of the measuring points are 1, 2, 3, ... , n-1, n.

[0013] The measurement method is as follows: when measuring, first place the collimator (total station, theodolite) at the endpoint A, take the measurement point 2 as the aiming point, and observe the local deviation value of point 1 relative to the reference line A-2 △ 1 , then move the instrument to measuring point 1, take measuring point 3 as the aiming point, and observe the local deviation value △ of point 2 relative to baseline 1-3 2 ;..., and so on, until point B at the other end of the line of sight, measure the local deviation value △ of measuring point n on the relative reference line (n-1)-B n .

[0014] from figure 1 It can be seen that the deviation value δ of any measuring point i relative to ...

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Abstract

The invention discloses a collimation line deformation measurement method. A kth period observation deviation value delta(k) of the ith measurement point of a long distance collimation line relative to a reference line is calculated by utilizing the following formula (the formula is expressed in the specification), wherein n is the number of the measurement points of the long distance collimation line, delta<j>(k) is a kth period observation local deviation value of the jth measurement point relative to the reference line formed by the connecting line of the (j-1)th measurement point and the (j+1) measurement point, and r=2,3,..., n+1; and the deformation value of the ith measurement point is difference of the kth period observation deviation value of the ith measurement point and the first period observation deviation value of the ith measurement point. The problems that the reference line of total length acts as a collimating reference, and the target is vague, collimating accuracy is poor, a backsight point and the measurement point are far apart from each other and influence of focusing error of a telescope is high when the reference line is long can be effectively solved so that influence of atmospheric refraction on the observation result can be effectively reduced. The method is simple, high in measurement accuracy and convenient in application in actual work.

Description

technical field [0001] The invention relates to a line-of-sight measurement method for engineering safety monitoring, in particular to a line-of-sight deformation measurement method. Background technique [0002] The line of sight method has been widely used in the deformation observation of dams and other engineering buildings. It has the characteristics of simple observation principle, low investment, and easy implementation, and has derived a variety of observation methods, such as segmented view Sight line, line of sight at midpoint, etc. However, they are all based on the full-length reference line, that is, the instrument must be placed at one end point to aim at the other end point during measurement. [0003] When the reference line is too long, the two ends are far away, the target is blurred, the aiming accuracy is too poor, and the distance between the backsight point and the measuring point is too far, the influence of the telescope focusing error is greater, an...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B21/32
CPCG01B21/32
Inventor 邱山鸣廖佳赫晓光
Owner POWERCHINA ZHONGNAN ENG
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