A power mosfet package thermal resistance comparison device

A comparison device and power technology, which is applied in the field of power MOSFET package thermal resistance comparison devices, can solve the problems of high cost of use of measurement devices and low accuracy of comparison results, and achieve practical production and use, and reduce the effect of current differences

Active Publication Date: 2018-06-12
华羿微电子股份有限公司
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  • Application Information

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Problems solved by technology

[0005] The invention provides a power MOSFET package thermal resistance comparison device to solve the problems of high cost of use and low accuracy of comparison results in the prior art

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  • A power mosfet package thermal resistance comparison device
  • A power mosfet package thermal resistance comparison device

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Embodiment Construction

[0016] In order to make the object, technical solution and advantages of the present invention clearer, the implementation manner of the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0017] The embodiment of the present invention discloses a power MOSFET packaging thermal resistance comparison device, which is more practical than the two methods provided in the aforementioned prior art when simply comparing the packaging thermal resistance of a power MOSFET to determine its performance. Moreover, the device has low cost and high comparison accuracy, and is very practical in actual production and use.

[0018] refer to figure 1 As shown, a power MOSFET packaging thermal resistance comparison device provided by an embodiment of the present invention includes an AC input power supply, an adjustable DC power supply, a switching power supply, a constant current control board, a dual point thermometer, a power MOSFET and...

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Abstract

The invention provides a power MOSFET packaging thermal resistance comparison device, which comprises an adjustable DC power source, a switch power supply, a constant current control panel, a double-channel point temperature meter, a power MOSFET and a heat radiator. The power MOSFET is arranged on the heat radiator; the constant current control panel accurately controls different power MOSFETs to work in an amplification area and ensures same power consumption; and the double-channel point temperature meter measures the temperature on the surface of the power MOSFET and the temperature of the heat radiator at the lower portion of the power MOSFET. Through the control function of the constant current control panel, the current passing through the power MOSFETs is allowed to be controlled accurately, thereby greatly reducing the current difference since different power MOSFETs have start voltage difference; and meanwhile, under the condition of same power consumption, the temperature on the surface of the power MOSFET and the temperature of the heat radiator at the lower portion of the power MOSFET are measured by the double-channel point temperature meter, and thus packaging thermal resistance of the different power MOSFETs can be compared accurately and quickly.

Description

technical field [0001] The invention relates to the technical field of semiconductor testing, in particular to a power MOSFET package thermal resistance comparison device. Background technique [0002] For power MOSFETs, its performance is not only related to the electrical parameters of the chip, but also the plastic encapsulant, frame, solder (or adhesive), leads and production process selected in the packaging process will also have a great impact on its performance. One of the parameters that has a greater impact on its performance is the thermal resistance of the package. The size of the thermal resistance of the package indicates its ability to diffuse heat to the outside, which plays a key role in the reliability of the product. Therefore, in actual production and use, it is often necessary to simply compare or measure the package thermal resistance of power MOSFETs to determine their performance. [0003] At present, thermal resistance testers are generally used to ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26
CPCG01R31/2628
Inventor 刘义芳
Owner 华羿微电子股份有限公司
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