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A test control method for a distributed test system

A test system, test control technology, applied in the direction of test/monitoring control system, electrical test/monitoring, general control system, etc., can solve problems such as system paralysis, cumbersome and complex large-scale distributed test system, and achieve convenient maintenance and distribution Efficient testing and the effect of increasing node utilization

Active Publication Date: 2019-01-22
INST OF MICROELECTRONICS CHINESE ACAD OF SCI
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Problems solved by technology

The control command transmission of the downlink communication from the central computer to the test terminal and the data transmission of the uplink communication from the test terminal to the central computer adopt a structure of one total and multiple points. There must be a central control system, and each node depends on the central control system. Work, if there is a problem with the central system, it will lead to the paralysis of the entire system, and the central control system must be maintained and replaced. This process is very cumbersome and complicated for a large-scale distributed test system

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Embodiment Construction

[0024] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0025] An embodiment of the present invention provides a test control method for a distributed test system, the distributed test system includes a plurality of nodes, figure 1 It is a connection structure between nodes in a distributed test system, each node is connected through a data exchange bus, and the maximum number of nodes can reach 256. Such as figure 2 As shown, the method includes:

[0026] S21. One of the nodes in the distributed test system sen...

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Abstract

The invention discloses a test control method for a distributed test system. The distributed test system includes a plurality of nodes. The method includes the steps that one node in the distributed test system sends a command to other nodes, applies to obtain a control right as a general control node, and controls other partial nodes to perform the test; each partial node receives the command of the general control node and performs the test, and returns a test result to the general control node; after the test finishes, the general control node sends another command to each partial, finishes the test, and gives up the control right; and when the next test begins, any one partial node in the distributed test system re-sends the command, applies to obtain the control right as the general control node, and controls other partial nodes to perform the next round test. According to the invention, the flexible expansion of the distributed test system is convenient, and the whole test process is more efficient.

Description

technical field [0001] The invention relates to the technical field of distributed test systems, in particular to a test control method for a distributed test system. Background technique [0002] Distributed test systems with a large number of test terminals are widely used in industrial production. During the test process, the distributed test terminal controls and tests each sub-node, and the master node conducts data analysis according to the test results of the sub-nodes. [0003] Distributed testing has high requirements on the flow control of the testing process, and needs to obtain the global status in real time to guide the testing process. Therefore, most distributed testing systems currently use a centralized control system. There is a control center in the system to collect and analyze the test results of each terminal. The control command transmission of the downlink communication from the central computer to the test terminal and the data transmission of the ...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G05B23/02
CPCG05B23/0218
Inventor 刘谋孟真张兴成唐璇阎跃鹏
Owner INST OF MICROELECTRONICS CHINESE ACAD OF SCI
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