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Statistical process control method of mean-standard deviation control charts of samples of different sizes

A technique of statistical process control and standard deviation, which is applied in general control systems, control/regulation systems, program control, etc., and can solve problems such as the inability to establish control charts for statistical process control

Active Publication Date: 2016-06-15
XIDIAN UNIV
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Problems solved by technology

When the sample size is different, the method of traditional control chart is no longer applicable, and it is impossible to establish a control chart for statistical process control

Method used

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  • Statistical process control method of mean-standard deviation control charts of samples of different sizes
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  • Statistical process control method of mean-standard deviation control charts of samples of different sizes

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Embodiment Construction

[0040] Below in conjunction with the accompanying drawings, the present invention will be further described by taking a company producing 5 ohm resistors as an example.

[0041] refer to figure 1 , the implementation steps of the present invention are as follows:

[0042] Step 1: Collect a sample.

[0043] 1a) When a batch of products is processed, a sampling ratio of 1% is used for equal sampling, and the sample data is obtained after measuring the sample;

[0044] 1b) 25 batches of sample data are obtained after 25 consecutive collections, as shown in Table 1, and the size of the i-th batch of samples is n i , the j-th sample of the i-th batch is x ij , where i=1,2,…,25, j=1,2,…n i .

[0045] Table 1 Resistor Sample Data

[0046]

[0047]

[0048] Step 2: According to the data in Table 1, use the following formula to calculate the mean value X of the i-th batch i and standard deviation s i :

[0049] X ‾ ...

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Abstract

The invention discloses a statistical process control method of mean-standard deviation control charts of samples of different sizes, and mainly solves the problem that existing control charts cannot implement statistical process control when samples are different in size. The implementation steps include: 1. obtaining product samples; 2. calculating to obtain a mean value and standard deviation of each set of samples; 3. obtaining a matrix mean value and standard deviation; 4. calculating respective corresponding characteristic values of two control charts in the mean-standard deviation control charts, and obtaining respective corresponding control lines of the two control charts in the mean-standard deviation control charts; 5. according to a drawing method of a Shewhart control chart, drawing corresponding control charts with the characteristic values and control lines; and 6. using a process abnormality judgment criterion to judge the control charts in the Step 5, so as to obtain a result of whether a production process is in a controlled state. The statistical process control method provided by the invention has a wide range of application, calculation accuracy of the mean value and standard deviation of the matrix is high, and the method can be used for statistical process control of samples of the same size or different sizes.

Description

technical field [0001] The invention belongs to the field of production quality control, and in particular relates to a statistical process control method, which can be used for the statistical process control of monitoring whether the production state is in a controlled state when the sample size is different. Background technique [0002] "Statistical Process Control" is one of the most popular and effective quality improvement methods today. Statistical process control technology mainly refers to the use of Shewhart's process control theory, that is, the control chart to monitor the various stages of the product in the production process, that is, the quality characteristics of the process, and analyze the trend of the quality characteristics according to the point distribution on the control chart. Preventive measures to ensure that the production process is in a state of statistical control, so as to achieve the purpose of improving and ensuring quality. However, the p...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05B19/418
CPCY02P90/02G05B19/41875
Inventor 田文星游海龙顾铠贾新章
Owner XIDIAN UNIV
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