Quick heating device for high-temperature SHPB dynamic impact experiment

Abstract

The invention discloses a quick heating device for a high-temperature SHPB dynamic impact experiment. The device comprises an upper box, a lower box, a temperature sensor, a heating channel, a guide rail, an electric-thermal conversion device, a hinge, a wire, a temperature measurement hole, a heating tile, heat insulation cotton, a wall, a handle, a ring, a fastener and a heat insulation plate, wherein the temperature sensor is connected with a temperature control device to regulate the temperature inside the heating device in real time, temperature is displayed through the temperature control device, and precise control of heating temperature is achieved; by arranging the heat insulation plate, dissipation of temperature does not occur easily, temperature inside a test piece and temperature outside the test piece can be made consistent, and the situation that the temperature of the test piece is uneven is avoided. The device not only can heat test pieces independently but also can quickly installing and heating test pieces, heating and impacting can be conducted at the same position, test pieces can be positioned accurately, the structure is simple and compact, operation is easy, working efficiency is high, capital input is low, and the device is economical and convenient to popularize.

Description

technical field [0001] The invention relates to the field of SHPB experimental auxiliary devices, in particular to a rapid heating device for high-temperature SHPB dynamic impact experiments. Background technique [0002] SHPB dynamic experiments are widely used in the study of material properties, but most of them are material experiments at room temperature, but high-temperature conditions also exist, so research on material properties at high temperatures is also required. At present, the SHPB high-temperature experiment method can be roughly divided into two types: one is to put the test piece and part of the probe into the temperature box and heat it at the same time. Xia Kaiwen et al., Experimental Mechanics, 1998, Vol.13, No. 3, PP.307-313) used a constant temperature heating furnace, and used the one-dimensional stress wave propagation theory and heat transfer principle to correct the influence of the temperature gradient field on the waveform measurement. The diffi...

AI Technical Summary

Problems solved by technology

At present, the SHPB high-temperature experiment method can be roughly divided into two types: one is to put the test piece and part of the probe into the temperature box and heat it at the same time. Xia Kaiwen et al., Experimental Mechanics, 1998, Vol.13, No. 3, PP.307-313) used a constant temperature heating furnace, and used the one-dimensional stress wave propagation theory and heat transfer principle to correct the influence of the temperature gradient field on the waveform measurement. The difficulty lies in the complexity of experimental data processing

The invention patent titled "Rapid Heating Device for High-Temperature Hopkinson Compression Bar Experiment" describes a rapid heating method for specimens. Due to the temperature rise effect, ceramic rods with the same outer diameter are designed on the incident rod and the transmission rod, ignoring the difference in the propagation of stress waves in different media, and also ignoring the error caused by the incident rod not directly impacting the test piece, which affects The accuracy of the experimental data

The other is to heat the specimen separately first, and quickly install the specimen in the system before the experiment. The article titled "Automatic Assembly Technology for SHPB System High Temperature Experiment" (Zhang Fangju et al., Experimental Mechanics, 2005, Vol.20, No. 2 period, PP.281-284) and the invention patent (Patent No.: ZL200610021096.5) titled "Automatic assembly device for two-way double-gas path for high-temperature Hopkinson pressure bar experiment" describes a two-way double-gas path for Hopkinson experiment Road automatic assembly device, its defect is that it is difficult to realize the quasi-static docking and synchronization of the system, and requires a very high-precision experimental device

Images