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Relevance model-based testability prediction method

A correlation model and testing technology, applied in the direction of hardware monitoring, etc., can solve the problem of poor operability of the engineering prediction method, and achieve the objective and accurate effect of the prediction method.

Active Publication Date: 2016-07-20
BEIJING INST OF ELECTRONICS SYST ENG
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Problems solved by technology

[0005] The purpose of the present invention is to provide a testability prediction method based on a correlation model, which shows the correlation between each component and test point by clarifying the functional flow of the product and the interconnection relationship of each component, and specifying the position of the test point. According to the test correlation model, the correlation matrix is ​​obtained; through the calculation of the correlation matrix, the product's fault detection rate and fault isolation rate indicators are obtained, so as to complete the testability of the product Predict work, solve the problem of poor operability of engineering forecast method

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[0019] In order to illustrate the present invention more clearly, the present invention will be further described below in conjunction with preferred embodiments and accompanying drawings. Similar parts in the figures are denoted by the same reference numerals. Those skilled in the art should understand that the content specifically described below is illustrative rather than restrictive, and should not limit the protection scope of the present invention.

[0020] Taking the product as an example of a radar control machine combination, the method for predicting the correlation model testability of the radar control machine combination will be described below.

[0021] A testability prediction method based on a correlation model, the specific steps are:

[0022] Step 1: Perform a failure mode and effects analysis (FMEA) on the product.

[0023] Product name: Radar control machine combination.

[0024] Product composition: The radar controller combination includes multiple pa...

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Abstract

The invention discloses a relevance model-based testability prediction method. The method comprises the following steps: indicating the relevance relationship between each component and a test point through defining the interconnection relationship between the function flow direction of a product and each component as well as the position of the test point, and establishing a test relevance model of the product; obtaining a relevance matrix according to the test relevance model; and calculating the relevance matrix to obtain a fault detection rate and a fault isolation rate index of the product so as to complete the testability prediction work of the product and solve the problem that a project prediction method is not strong in operability. The method is particularly suitable for the testability prediction of products when the data such as fault rates and occurrence frequencies of various fault modes at the initial development stage of the products.

Description

technical field [0001] The present invention relates to the technical field of product testability prediction. More specifically, it relates to a testability prediction method based on a correlation model. Background technique [0002] The traditional testability prediction mostly adopts the engineering prediction method, that is, the product designer fills in the corresponding testability prediction form, which includes the failure rate of the unit under test, the failure mode of the unit under test, the frequency ratio of each failure mode, and the Whether a failure mode can be detected and isolated. Finally, the fault detection rate is calculated by the ratio of the detectable fault rate to the total fault rate, and the fault isolation rate is calculated by the ratio of the isolated fault rate to the detectable fault rate. [0003] The implementation of the testability engineering prediction method requires a large amount of reliability analysis data and testability / BIT...

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Application Information

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IPC IPC(8): G06F11/34
Inventor 时旺孙日芬杨清伟
Owner BEIJING INST OF ELECTRONICS SYST ENG
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