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Application low memory test method, apparatus and system

A technology of application programs and testing methods, applied in the field of testing, can solve the problems of low efficiency of manual testing, and achieve the effect of high testing efficiency and low memory testing

Inactive Publication Date: 2016-07-27
TENCENT TECH (SHENZHEN) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Based on this, it is necessary to address the low efficiency of traditional manual testing and provide a low-memory testing method for applications that can improve testing efficiency

Method used

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  • Application low memory test method, apparatus and system
  • Application low memory test method, apparatus and system
  • Application low memory test method, apparatus and system

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Embodiment Construction

[0040] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0041] It can be understood that the terms "first", "second" and the like used in the present invention can be used to describe various elements herein, but these elements are not limited by these terms. These terms are only used to distinguish one element from another element. For example, a first client could be termed a second client, and, similarly, a second client could be termed a first client, without departing from the scope of the present invention. Both the first client and the second client are clients, but they are not the same client.

[0042] figure 2 It is a schematic diagram of ...

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PUM

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Abstract

The application relates to an application low memory test method, apparatus and system. The method comprises the following steps: obtaining current operating page data of a tested application, and recording the data as first data; switching the tested application to a background; receiving a starting instruction, and starting a memory consumption application according to the starting instruction; if it is detected that the tested application is killed, receiving a termination instruction, and terminating the memory consumption application according to the termination instruction; restarting the tested application, obtaining current operating page data, and recording the data as second data; and determining whether the first data and the second data is consistent with predetermined expectation, if so, allowing the tested application to pass the test, and if not, allowing the tested application not to pass the test. According to the application low memory test method, apparatus and system disclosed by the present invention, application low memory test is implemented without manually test, and test efficiency is high.

Description

technical field [0001] The invention relates to the field of testing, in particular to a low-memory testing method, device and system for application programs. Background technique [0002] The Android system is a multitasking system. Users can start multiple applications on the Android device. In order to reduce the time overhead when the Android application starts, when the user exits an application or exits the application to the background, the system will not immediately Free up the memory occupied by the application, so that the next time the application is launched, it can run faster. But when the available memory of the system reaches the system's memory warning value, the Lowmemorykiller mechanism in the Android system will kill some less important applications according to the importance of the applications, so as to ensure that the Android system can continue to run normally. [0003] In the field of software development and testing, in order to ensure that the a...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3684G06F11/3688
Inventor 王寸涛吴建国
Owner TENCENT TECH (SHENZHEN) CO LTD