Metallographical low-temperature observation device

Abstract

The invention discloses metallographical low-temperature observation device .The device comprises a cold delivery channel connected with a low-temperature cold head, a low-temperature platform used for carrying an observation sample, a vacuum cover used for containing the cold delivery channel and the low-temperature platform, and an observation window formed in the upper portion of the vacuum cover .A moving sliding block is placed on the low-temperature platform and can slide relative to the low-temperature platform, and the low-temperature platform and the moving sliding block are both connected and fixed to the observation sample .The device further comprises a tension-compression rod connected with the moving sliding block .By means of the device, tension and compression of the sample material under the low temperature condition can be observed; besides, the device is compact in structure and convenient to operate.

Description

technical field [0001] The invention relates to the technical field of metallographic observation, in particular to a device for metallographic low-temperature observation. Background technique [0002] The mechanical, chemical, and thermal properties of metals are closely related to the internal structure of metals. Metallographic microanalysis methods are used to observe the microstructure of materials by making metallographic samples and under a metallographic microscope. , can analyze, detect and study the internal structure and defects of metals and alloys, can obtain the relationship between the structure of metals and alloys and their chemical components, can determine the microstructure of various alloy materials after different processing and heat treatment, and can judge the quality of materials pros and cons. Therefore, metallographic observation and analysis are of great significance in the fields of metallurgy and materials science, and have been widely used in...

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Problems solved by technology

[0003] In recent years, scientific research on materials has found that the deformation mechanism of the microstructure of materials at low temperature is significantly different from that at room temperature. In the current research on the low temperature characteristics of materials, the material is first treated at low temperature and then returned to room temperature. For observation and analysis, this method is difficult to meet the needs of analyzing sample materials at low temperature, and it is impossible to directly observe and analyze the microstructure of materials under deformation excitation under low temperature conditions through a high-magnification microscope system.

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