Reflective spectral measuring system with self-calibration function

A reflection spectrum and measurement system technology, applied in the direction of color/spectral characteristic measurement, measurement device, material analysis through optical means, etc., can solve problems such as limiting measurement speed and measurement error cannot be completed

Active Publication Date: 2016-08-03
WENZHOU UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a reflection spectrum measurement system with self-calibration function in view of the deficiencies of the current reflectance measurement system requiring manual calibration, limiting the measurement speed, introducing personnel measurement errors and inability to complete unattended measurement

Method used

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  • Reflective spectral measuring system with self-calibration function
  • Reflective spectral measuring system with self-calibration function
  • Reflective spectral measuring system with self-calibration function

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Embodiment

[0022] Embodiment: a kind of reflection spectrum measurement system with self-calibration function, such as figure 1 shown. The transverse guide rail 2 and the longitudinal guide rail 3 are arranged vertically and equal to each other on the same horizontal plane, and the longitudinal guide rail 3 is provided with a longitudinal rail clamping slot 17 towards the end of the transverse guide rail 2, and a plurality of transverse rail clamping slots 16 are horizontally arranged on the transverse guide rail. The top surface of the vertical rail card slot and the horizontal rail card slot is open. The longitudinal rail slot 17 opens toward the side of the transverse guide rail 2 and is set as a trumpet-shaped guide opening on the opening side; the transverse rail slot 16 opens toward the side of the longitudinal guide rail 3 and rounds the edges on the side of the opening to facilitate entry and exit . The sample slots 1 to be measured are placed in the slots 16 of the horizontal ...

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Abstract

The invention relates to a reflective spectral measuring system with self-calibration function, and the system can calibrate automatically and measure accurate reflectivity of samples in batches. The system comprises a spectral acquisition system, and also comprises a horizontal guide rail and a vertical guide rail. The horizontal guide rail and the vertical guide rail are arranged orthogonality. A plurality of horizontal rail grooves are disposed on the horizontal guide rail, and sample grooves are disposed on the horizontal rail grooves. A vertical rail groove is disposed on one end of the vertical guide rail which faces the horizontal guide rail, and a standard blank board used for calibrating the spectral acquisition system is disposed on one side of the vertical rail groove. The back and forth movement of the vertical guide rail can make the vertical rail groove and the standard blank board align with the spectral acquisition system, and a swing carrying mechanism used for carrying sample grooves between horizontal rail groove and vertical rail groove is disposed under the horizontal rail groove and vertical rail groove. The system realizes self-calibration and measure of the reflective spectral, has no need of manual intervention, can perform automatic exchange and batch measure of the test samples, and can improve the measure speed and reduce the measuring error.

Description

technical field [0001] The invention belongs to the field of spectrum measurement, and relates to a reflection spectrum measurement system with self-calibration function, which can measure the accurate reflectance of samples in batches. Background technique [0002] The reflection spectrum curve refers to the characteristic that the ability of a substance to reflect electromagnetic radiation varies with the wavelength of the reflected electromagnetic wave. For example, the change of wavelength is represented by the abscissa, and the reflectance is represented by the ordinate, which can form a curve reflecting the reflection spectrum characteristic, which is called the reflection spectrum characteristic curve. When substances with different properties, or substances with the same properties are different in composition, color, surface structure, moisture content, etc., their reflection spectrum characteristics are also different, which constitutes the difference in reflection...

Claims

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Application Information

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IPC IPC(8): G01N21/27
CPCG01N21/27G01N21/278
Inventor 陈孝敬赵海艇陈熙施一剑
Owner WENZHOU UNIVERSITY
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