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A iv test device for crystalline silicon solar energy busbar-free cells

A test device and cell technology, applied in photovoltaic power generation, electrical components, photovoltaic system monitoring, etc., can solve problems such as inaccurate measurement, uneven pressure, cracking of crystalline silicon solar cells, etc., to ensure accuracy and avoid The effect of breaking and maintaining pressure balance

Active Publication Date: 2018-03-06
ZHEJIANG JINKO SOLAR CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The disadvantages of the probe row of the existing non-busbar solar cell measurement equipment are: the pressure of the upper and lower probe rows is not uniform, resulting in the rupture of the crystalline silicon solar cell; if the flat-head probe is used, if the electrode of the solar cell is oxidized, Then the probe head cannot pierce the electrode, resulting in inaccurate measurement

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  • A iv test device for crystalline silicon solar energy busbar-free cells
  • A iv test device for crystalline silicon solar energy busbar-free cells
  • A iv test device for crystalline silicon solar energy busbar-free cells

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Embodiment Construction

[0040] As described in the background technology section, the shortcoming of the probe row of the existing non-busbar solar cell sheet measurement equipment is: the pressure of the upper and lower probe row is not uniform, causing the crystalline silicon solar cell sheet to rupture; using flat probes, if If the electrode of the solar cell is oxidized, the probe head cannot penetrate the electrode, resulting in inaccurate measurement.

[0041] Based on this, an embodiment of the present invention provides a method for IV testing of crystalline silicon solar energy busbar-free cells, including:

[0042] Transport the non-busbar cells to the top of the cell carrying platform, and the calibration mechanism corrects the position of the non-busbar cells;

[0043] Raise the cell carrying platform, and withdraw from the calibration mechanism after the cells are vacuum-adsorbed;

[0044] raising the lower probe row of the cell carrying platform, so that the lower probe row penetrates ...

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Abstract

The invention discloses a crystalline silicon solar main-grid-free battery sheet IV test method and apparatus. The test method comprises the following steps: transporting a main-grid-free battery sheet to somewhere above a battery sheet load-bearing platform, and a correction mechanism correcting the position of the main-grid-free battery sheet; raising the battery sheet load-bearing platform, and after the battery sheet is adsorbed in a vacuum mode, removing the correction mechanism; raising a lower probe row of the battery sheet load-bearing system to enable the lower probe row to be stabbed into the back surface of the main-grid-free battery sheet; pressing down a front-surface test platform to press a silk screen structure at the front-surface test platform into a front-surface grid wire of the main-grid-free battery sheet; and starting a xenon lamp of a test mechanism, enabling the main-grid-free battery sheet to be photoinduced to generate power, and at the same time, measuring electric performance of the main-grid-free battery sheet. According to the crystalline silicon solar main-grid-free battery sheet IV test method and apparatus, a press into an electrode is realized by use of the silk screen structure so that the measurement accuracy is ensured. The load-bearing platform absorbs the back surface of the battery sheet, the battery sheet maintains a pressure balance during upper and lower measurement, and thus the battery sheet is prevented from ruptures.

Description

technical field [0001] The invention relates to the technical field of testing crystalline silicon solar cells, in particular to an IV testing device for crystalline silicon solar cells without bus bars. Background technique [0002] At present, conventional crystalline silicon solar cells have 3-5 busbars of silver paste on the front side, and the busbars will block the surface of the solar cell, thereby affecting the absorption of light by the cell, thereby affecting its power generation efficiency. [0003] In the follow-up new crystalline silicon solar cell, the front busbar is canceled, but it brings new difficulties to test the electrical performance of the cell. At present, the conventional measurement of solar cells is to measure the electrical properties of the cells by means of two rows of probes at the top and bottom. High-efficiency solar cells (IBC, MWT solar cells) introduce both positive and negative electrodes to the back, so as to collect electrical perform...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H02S50/10
CPCH02S50/10Y02E10/50
Inventor 卫志敏
Owner ZHEJIANG JINKO SOLAR CO LTD