AFDD testing system based on parallel metallic contact arc fault
A contact arc and testing system technology, applied in the direction of measuring devices, measuring electrical variables, instruments, etc., can solve the problems of various sizes and specifications of test cables, unable to meet test requirements, and difficult automatic control.
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[0027] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.
[0028] like Figure 1~4 As shown, the present invention provides a kind of AFDD test system based on parallel metallic contact arc fault, including cutting cable test device, AFDD test device electrically connected with the cut cable test device and carrying out data communication with the AFDD test device The upper computer measurement and control analysis platform; the AFDD test system includes an MCU control unit, a first isolation control module, a second isolation control module, an AFDD test module and a tripping detection module, and the MCU control unit passes through the first isolation control module The AFDD test module is electrically connected to the AFDD test module, and the AFDD test module is electrically connected to the first isolation module through the trip detection module; the MCU control unit is electrically connected to ...
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